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Displaying 37326 - 37350 of 73697

Integrating IT Security into the Capital Planning and Investment Control Process

January 1, 2005
Author(s)
Joan Hash, N Bartol, H Rollins, W Robinson, J Abeles, S Batdorff
Traditionally, information technology (IT) security and capital planning and investment control (CPIC) processes have been performed independently by security and capital planning practitioners. However, the Federal Information Security Management Act

Internet-Based Surface Metrology Algorithm Testing System

January 1, 2005
Author(s)
Mark C. Malburg, Jayaraman Raja, Son H. Bui, Thomas Brian Renegar, Bui Son Brian, Theodore V. Vorburger
Software is an integral part of most measurement systems and it is particularly important in roughness measurement and analysis. Evaluation and assessment of measured roughness profiles must be performed in accordance with standards. Different types of

IPC-Split Cylinder Standard

January 1, 2005
Author(s)
James R. Baker-Jarvis
This method is intended for the nondestructive measurement of the relative permittivity and loss tangent of unclad dielectric substrates at microwave frequencies using a split-cylinder resonator

Issues in Line Edge and Linewidth Roughness Metrology

January 1, 2005
Author(s)
John S. Villarrubia
In semiconductor electronics applications, line edge and linewidth roughness are generally measured using a root mean square (RMS) metric. The true value of RMS roughness depends upon the length of edge or line that is measured and the chosen sampling

Line Edge Roughness Metrology Using Atomic Force Microscopes

January 1, 2005
Author(s)
Ndubuisi G. Orji, Theodore V. Vorburger, Joseph Fu, Ronald G. Dixson, C Nguyen, Jayaraman Raja
Line edge roughness measurements using two types of atomic force microscopes and two types of tips are compared. Measurements were made on specially prepared samples with inscribed edge roughness of different amplitudes and wavelengths. The spatial

Linewidth Measurement from a Stitched AFM Image

January 1, 2005
Author(s)
Joseph Fu, Ronald G. Dixson, Ndubuisi G. Orji, Theodore V. Vorburger, C Nguyen
Image stitching is a technique that combines two or more images to form one composite image, which provides a field of view that the originals cannot. It has been widely used in photography, medical imaging, and computer vision and graphics. For such

Liquid state NMR simulations of quantum many-body problems

January 1, 2005
Author(s)
C. Negrevergne, Rolando Somma, Gerardo Ortiz, Emanuel Knill, R. Laflamme
Recently developed quantum algorithms suggest that in principle, quantum computers (QCs) can solve problems such as simulation of physical systems more efficiently than classical computers. As a small- scale demonstration of this capability of quantum
Displaying 37326 - 37350 of 73697
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