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Displaying 36976 - 37000 of 73929

Thermodynamic Properties of Diphenylmethane

March 30, 2005
Author(s)
Robert D. Chirico, William Steele
Measurements leading to the calculation of the standard thermodynamic properties for gaseous diphenylmethane (Chemical Abstracts registry number [101-81-5]) are reported. Experimental methods include adiabatic heat-capacity calorimetry, vibrating-tube

Simultaneous Visible and Thermal Imaging of Metals During Machining

March 28, 2005
Author(s)
Eric P. Whitenton, Robert W. Ivester, Howard W. Yoon
In order to investigate temperatures reached during orthogonal metal cutting, a novel approach for measuring temperatures at the tool-chip interface has been developed based on high-speed thermography. A thermal infrared camera and a visible camera

Intrinsic Surface States in Semiconductor Nanocrystals: HgS Quantum Dots

March 23, 2005
Author(s)
James S. Sims, Garnett W. Bryant, Howard Hung
Confined states in typical nanocrystals are localized to the dot interior. Surface states are extrinsic states localized at unsaturated dangling bonds or surface defects. We show that intrinsic surface states occur in nanocrystals made from negative gap

Challenges in Metrology for the Semiconductor Industry

March 21, 2005
Author(s)
Stephen Knight, Joaquin (. Martinez
Leading edge Ultra Large Scale Integrated Circuit manufacture is now well into the realm of Nanoelectronics, with some critical dimensions below 40 nm. The pressures on metrology supporting this manufacture are escalating rapidly. In this presentation we

Chip-Scale Atomic Frequency References: Fabrication and Performance

March 21, 2005
Author(s)
John E. Kitching, Svenja A. Knappe, Li-Anne Liew, John Moreland, Hugh Robinson, P Schwindt, V Shah, Vladislav Gerginov, Leo W. Hollberg
The physics package for a chip-scale atomic frequency standard was constructed and tested. The device has a total volume of 9.5 mm 3, dissipates 75 mW of electrical power at an ambient temperature of 45 °C and has a short-term fractional frequency

Frequency Biases Associated with Distributed Cavity Phase and Microwave Leakage in the Atomic Fountian Primary Frequency Standards IEN-CSF1 and NIST-F1

March 21, 2005
Author(s)
Steven R. Jefferts, Jon H. Shirley, Neil Ashby, Thomas P. Heavner, Elizabeth A. Donley, F Levi, Eric A. Burt, G J. Dick
The subject of frequency shifts in atomic frequency standards caused either by distributed cavity phase or microwave leakage goes back to the earliest days of the thermal beam standards [1,2], and has been the subject of continuing theoretical and

High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials

March 21, 2005
Author(s)
Dale E. Newbury, J H. Scott, Scott A. Wight, J T. Armstrong, John A. Small
Transmission (TEM) and scanning electron microscopes (SEM) provide ideal platforms for electron and x-ray spectrometry to characterize nanoscale particles and nanostructured bulk materials. Electron spectrometry includes electron energy loss spectrometry

Propagation of Uncertainties in Measurements Using Structural Inference

March 21, 2005
Author(s)
Hariharan K. Iyer, Chih-Ming Wang
The ISO Guide to the Expression of Uncertainty in Measurement (GUM) recommends the use of a first-order Taylor series expansion for propagating errors and uncertainties. The GUM also permits the use of other analytical or numerical methods when the
Displaying 36976 - 37000 of 73929
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