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NIST Authors in Bold

Displaying 36326 - 36350 of 73697

Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry Interlaboratory Comparison of Mixtures of Polystyrene With Different End Groups: Statistical Analysis of Mass Fractions and Mass Moments

July 1, 2005
Author(s)
Charles M. Guttman, S Wetzel, Kathleen M. Flynn, B M. Fanconi, David L. VanderHart, William E. Wallace
A matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF MS) interlaboratory comparison was conducted on mixtures of synthetic polymers having the same repeat unit and closely matching molecular mass distributions but with

On the Growth and Form of Spherulites

July 1, 2005
Author(s)
L Granasy, T Pusztai, G -. Tegze, James A. Warren, Jack F. Douglas
Many structural materials (metal alloys, polymers, minerals, etc.) are formed by quenching liquids to form crystalline solids. This highly non-equilibrium process leads to an extraordinary variety of polycrystalline growth patterns that are broadly termed

Prototype Implementation Based on the Machine Shop Information Model

July 1, 2005
Author(s)
Yung-Tsun Lee, Yan Luo, Guodong Shao
Interoperability between manufacturing software applications and simulation is currently extremely limited. A machine shop information model has been developed at the National Institute of Standards and Technology (NIST) as a part of system

Semiconductor Microelectronics and Naoelectronics Programs

July 1, 2005
Author(s)
Stephen Knight, Joaquin (. Martinez, Michele L. Buckley
The microelectronics industry supplies vital components to the electronics industry and to the U.S. economy, enabling rapid improvements in productivity and in new high technology growth industries such as electronic commerce and biotechnology. The

Smart Cards and Mobile Device Authentication: an Overview and Implementation

July 1, 2005
Author(s)
Wayne Jansen, Serban I. Gavrila, Clement Seveillac, Vladimir Korolev
The use of mobile handheld devices within the workplace is expanding rapidly. These devices are no longer viewed as coveted gadgets for early technology adopters, but have instead become indispensable tools that offer competitive business advantages for

Software Assurances Metrics and Tool Evaluation

July 1, 2005
Author(s)
Michael Sindelar
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

Thermodynamics of the Hydrolysis Reactions of Nitriles

July 1, 2005
Author(s)
Yadu D. Tewari, Robert N. Goldberg
Microcalorimetry and high-performance liquid chromatography (h.p.l.c) have been used to conduct a thermodynamic investigation of the following nitrilase catalyzed reactions: (1) benzonitrile(aq) + 2 H2O(l) = benzoic acid(aq) + ammonia(aq), (2)

Thin-film coatings: Carbon nanotube coatings promise better thermal detectors

July 1, 2005
Author(s)
John H. Lehman, Anne Dillon
With high thermal conductivity and resistance to damage, carbon nanotube coatings are a promising new technology for thermal detectors. NIST and NREL scientists are exploring this viable alternative with the aim of developing better radiometric standards

Towards Semantic-Based Supply Chain Integration

July 1, 2005
Author(s)
Nenad Ivezic, Nenad Anicic, Albert T. Jones, Zuran Marjanovic
We describe a novel Enterprise Application Integration (EAI) architecture based on existing B2B standards. We show how such an EAI architecture can use automated reasoning tools to provide application integration support and validation capabilities. We

Two Finger Matching with Vendor SDK Matchers

July 1, 2005
Author(s)
Craig I. Watson, Charles L. Wilson, Michael D. Indovina, Brian J. Cochran
This report is an extension of the NIST Studies of one-to-one Fingerprint Matching with Vendor SDK Matchers which evaluated the accuracy of SDK (Software Development Kit) based on COTS (Commercial Off-The-Shelf) fingerprint matching systems for one-to-one

Using X-Ray Topography to Inspect Surfaces of Single-Crystal Components

July 1, 2005
Author(s)
David R. Black
X-ray diffraction topography, which is sensitive to local strain and/or crystallographic orientation, provides a unique view of the surface of single-crystal samples and can be used to nondestructively inspect for surface and subsurface damage. The
Displaying 36326 - 36350 of 73697
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