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Displaying 36176 - 36200 of 74223

Ontology Formalization of Product Semantics for Product Lifecycle Management

November 1, 2005
Author(s)
Lalit Patil, Ram D. Sriram
Product Lifecycle Management (PLM) is a concept that takes into account that the development of a product is influenced by knowledge from various stakeholders throughout its lifecycle. Computing environments in the PLM framework are expected to have

Optics for Extreme Ultraviolet Lithography

November 1, 2005
Author(s)
Steven E. Grantham, Charles S. Tarrio, Shannon B. Hill, Thomas B. Lucatorto
Extreme Ultraviolet Lithography (EUVL) is considered by many to be the next generation lithography that will fabricate integrated circuits in the next decade. Although EUVL is conceptually similar to optical or deep-UV lithography, it represents a major

Optimized Transition-Edge X-ray Microcalorimeter with 2.4 eV Energy Resolution at 5.9 keV

November 1, 2005
Author(s)
Joel Ullom, James A. Beall, W.Bertrand (Randy) Doriese, William Duncan, S. L. Ferreira, Gene C. Hilton, Kent D. Irwin, Carl D. Reintsema, Leila R. Vale
We present measurements from a series of transition- edge x-ray microcalorimeters designed for optimal energy resolution. We used the geometry of the sensors to control their heat capacity and employed additional normal metal features and a perpendicular

Realization of a Controllable Metafilm (''Smart Surface'') Composed of Resonant Magnetodielectric Particles: Measurements and Theory

November 1, 2005
Author(s)
Christopher L. Holloway, Pavel Kabos, Mohamed Mohamed, Edward Kuester, Michael D. Janezic, James R. Baker-Jarvis
In previous work, we derived generalized sheet-transition conditions (GSTCs) for the average electromagnetic fields across a metafilm, which, when properly designed, can have certain desired reflection and transmission properties. A metafilm is the two

Restructuring of Tungsten Thin Films Into Nanowires and Hollow Square Cross-Section Microducts

November 1, 2005
Author(s)
P. M. Parthangal, Richard E. Cavicchi, Christopher B. Montgomery, Shirley Turner, Michael R. Zachariah
We report on the growth of nanowires and unusual hollow microducts of tungsten by thermal treatment of tungsten films in a RF H2/Ar plasma at temperatures between 550-620 C. Nanowires with diameters of 10-30 nm and lengths between 50-300 nm were formed

Robust Optimization for Smart Machining System: An Enabler for Agile Manufacturing

November 1, 2005
Author(s)
Laurent Deshayes, Lawrence A. Welsch, Robert W. Ivester, M A. Donmez
This paper reports our efforts towards developing a mathematical and information framework for optimization of machining processes within a Smart Machining System (SMS). An SMS uses diverse integrated technologies that enable an enterprise to: (1) produce

Scanning electron microscope dimensional metrology using a model-based library

November 1, 2005
Author(s)
John S. Villarrubia, Andras Vladar, Michael T. Postek
The semiconductor electronics industry places significant demands upon secondary electron imaging to obtain dimensional measurements that are used for process control or failure analysis. Tolerances for measurement uncertainty and repeatability are smaller

Secure Messaging in BACnet

November 1, 2005
Author(s)
David G. Holmberg
A proposal for BACnet secure messaging is nearing public release by the BACnet standard committee (ASHRAE SSPC-135). The proposal adds a level of BACnet specific security to existing IT security, extending the BACnet standard to offer basic security using
Displaying 36176 - 36200 of 74223
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