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Displaying 36001 - 36025 of 74376

The History of Instrumented Impact Testing

December 15, 2005
Author(s)
M. P. Manahan, Thomas A. Siewert
Pendulum impact testing is widely known to have a history that extends back to the turn of the last century. To many researchers today, instrumentation of the impact test to acquire a load-time history, and thereby provide important data in addition to

Self-Oscillating Rubidium Magnetometer using Nonlinear Magneto-Optical Rotation

December 14, 2005
Author(s)
P Schwindt, Leo W. Hollberg, John E. Kitching
The detection of nonlinear magneto-optical rotation (NMOR) of polarized light through alkali atomic vapor is a highly sensitive technique for measuring magnetic fields. We demonstrate that when using frequency modulated light to excite the NMOR resonance

Assessment of Resolution and Dynamic Range for Digital Cinema

December 12, 2005
Author(s)
Charles D. Fenimore, A I. Nikolaev
The proponents of digital cinema seek picture quality exceeding that of the best film-based presentation. Quantifying the performance of systems for the presentation of high quality imagery presents several challenges. One is the dynamic range and the

CSS1 Test Suite

December 12, 2005
Author(s)
Frederick E. Boland Jr.
The goal of this document is to help W3C editors write better specifications, by making a specification easier to interpret without ambiguity and clearer as to what is required in order to conform. It focuses on how to define and specify conformance. It

HL7 Experimental Registry

December 12, 2005
Author(s)
William J. Majurski, A Mccaffrey, Mary T. Laamanen
Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and ignoring others. We develop a novel analytical technique that allows us to elegantly prove that

Protecting Digital Evidence from Modification

December 12, 2005
Author(s)
James R. Lyle
Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and ignoring others. We develop a novel analytical technique that allows us to elegantly prove that

Prototype of the NSRL Portable Hashing Environment

December 12, 2005
Author(s)
John M. Tebbutt
The goal of this document is to help W3C editors write better specifications, by making a specification easier to interpret without ambiguity and clearer as to what is required in order to conform. It focuses on how to define and specify conformance. It

User Guide for Prototype NSRL Portable Hashing Environment for NARA

December 12, 2005
Author(s)
John M. Tebbutt
Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and ignoring others. We develop a novel analytical technique that allows us to elegantly prove that

Wavelength References for Interferometry in Air

December 12, 2005
Author(s)
Richard W. Fox, Brian R. Washburn, Nathan R. Newbury, Leo W. Hollberg
Interferometer sources with multiple known wavelengths can be provided by tunable lasers and calibrated optical reference cavities. The mode wavelengths are known by measuring a laser¿s frequency while locked to the mode in vacuum during a calibration step

Repair of Formamidopyrimidines in DNA Involves Different Glycosylases - Role of the OGG1, NTH1, and NEIL1 Enzymes

December 9, 2005
Author(s)
J Hu, N de Souza-Pinto, K Haraguchi, Barbara A. Hogue, Pawel Jaruga, M M. Greenberg, Miral M. Dizdar, V. Bohr
2,6-diamino-4-hydroxy-5-formamidopyrimidine (FapyG) and 4,6-diamino-5-formamidopyrimidine (FapyA), are formed abundantly in DNA of cultured cells or tissues exposed to ionizing radiation or to other free radical-generating systems. We show here that FapyG

Consumer Packaging Labeling Guide: Selling by Count

December 5, 2005
Author(s)
K M. Dresser
[Withdrawn (February 12, 2018)]This guide is intended to provide manufacturers, packers, distributors, and retailers of packaged products with information about the labeling requirements for commodities that are sold by count in the consumer marketplace

High-Bandwidth Coaxial PWB Transmission Line Probe

December 5, 2005
Author(s)
Nicholas Paulter, Robert H. Palm, Dwight D. Barry
The design and test of a wide bandwidth (3 dB attenuation bandwidth > 20 GHz) , 50 ohm , coaxial probe for the electrical characterization of printed wiring board (PWB) transmission lines is described. The probe makes thousands of repeated contacts, using

Three-dimensional Scanning Optical Tweezers

December 5, 2005
Author(s)
Thomas W. LeBrun, T W. Hwang, I Y. Park, Jun-Feng Song, Yong-Gu Lee, Nicholas G. Dagalakis, Cedric V. Gagnon, Arvind K. Balijepalli
There are several new tools for manipulating microscopic objects. Among them, optical tweezers (OT) has two distinguishing advantages. Firstly, OT can easily release an object without the need of a complicated detaching scheme. Secondly, it is anticipated

Electrodeposition of Cu on Ru Barrier Layers for Damascene Processing

December 2, 2005
Author(s)
Thomas P. Moffat, Marlon L. Walker, P J. Chen, John E. Bonevich, William F. Egelhoff Jr., Lee J. Richter, Daniel Josell, C A. Witt, T Aaltonen, M Ritala, M Leskela
Superfilling of sub-micrometer trenches by direct copper electrodeposition onto PVD and ALD Ru barriers is demonstrated. The Cu nucleation and growth mode is found to be sensitive to the oxidation state of the Ru surface as well as the copper deposition

A Feature-Based Approach to Embedded System Hardware and Software Co-Design

December 1, 2005
Author(s)
XuanFang Zha, Steven J. Fenves, Ram D. Sriram
An embedded system is a hybrid of hardware and softwarethat combines software flexibility and hardware real-time performance. The co-design of hardware and software is the most critical but difficult issue in embedded system design. In this paper, we

A Low Differential-Pressure Primary Standard for the Range 1 Pa to 13 kPa

December 1, 2005
Author(s)
A P. Miiller, Charles R. Tilford, Jay H. Hendricks
The National Institute of Standards and Technology (NIST) has completed the development of a low differential-pressure primary standard covering a range from 1 Pa to 13 kPa for operation with line pressures up to 200 kPa. The standard is based on a UIM
Displaying 36001 - 36025 of 74376
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