Koo, S.
, Li, Q.
, Edelstein, M.
, Richter, C.
and Vogel, E.
(2005),
Silicon Nanowire Field Effect Transistor Test Structures Fabricated by Top-down Approaches, 2005 International Semiconductor Device Research Symposium, Bethesda, MD, USA
(Accessed January 17, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Silicon Nanowire Field Effect Transistor Test Structures Fabricated by Top-down Approaches
Published
Author(s)
, , , ,
Conference Dates
December 7-9, 2005
Conference Location
Bethesda, MD, USA
Conference Title
2005 International Semiconductor Device Research Symposium
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 8, 2005, Updated October 12, 2021