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NIST Authors in Bold

Displaying 34726 - 34750 of 73832

The Limits of Image-Based Optical Metrology

March 1, 2006
Author(s)
Richard M. Silver, Bryan M. Barnes, Ravikiran Attota, Jay S. Jun, James J. Filliben, Juan Soto, Michael T. Stocker, P Lipscomb, Egon Marx, Heather J. Patrick, Ronald G. Dixson, Robert D. Larrabee
An overview of the challenges encountered in imaging device-sized features using optical techniques recently developed in our laboratories is presented in this paper. We have developed a set of techniques we refer to as scatterfield microscopy which allows

The Other Monte Carlo Method

March 1, 2006
Author(s)
Isabel M. Beichl, Francis Sullivan
This is a general article on a Monte Carlo method different from the traditional Metropolis algorithm. Sampling is done according to a non-uniform probability distribution that is generated as the choice is being made.

Three Rings of Polyhedral Simple Functions

March 1, 2006
Author(s)
James F. Lawrence
We survey three ways to multiply elements of the additive subgroup of the group of real--valued functions on Rd which is generated by the indicator functions of polyhedra. In the resulting commutative rings, identities often correspond to useful techniques

Traceable Atomic Force Microscope Dimensional Metrology at NIST

March 1, 2006
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Joseph Fu, Michael W. Cresswell, Richard A. Allen, William F. Guthrie
The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. There are two major instruments being used for traceable measurements at NIST. The first is a custom in-house

Using LADAR to characterize the 3-D shape of aggregates: Preliminary results

March 1, 2006
Author(s)
Edward J. Garboczi, Geraldine S. Cheok, William C. Stone
In previous publications, we have shown how using x-ray computed tomography to obtain the raw 3-D data for the coordinates of the surface, and then converting this raw data into an analytical function for the surface via an expansion in spherical harmonic

In-Flight Suppressant Deployment Temperatures

February 28, 2006
Author(s)
Donald Bein
This report describes review of DoD military fixed-wing and rotary aircraft fire mishap/incident data applicable to assess temperatures at which aircraft fire suppressants have been deployed in engine nacelle and APU compartment fires. Another model is

Using NTP: Introduction and Recommended Practices

February 28, 2006
Author(s)
YaShian Li-Baboud
With future e-Manufacturing applications requiring precisely synchronized time for merging data from heterogeneous sources, it is necessary to understand the factors causing synchronization degradation in semiconductor factory distributed systems, and how

Improved Thermal Detector Coatings for Laser Radiometry at NIST

February 27, 2006
Author(s)
John H. Lehman
Nearly all of the radiometric standards for laser power and energy measurements at NIST and elsewhere in the world are based on thermal detectors. These detectors usually rely on a thermal absorber coating to enhance the detector responsivity. Ideally the

The Next Generation of Laser Radiometry at NIST

February 27, 2006
Author(s)
John H. Lehman, Christopher L. Cromer, Marla L. Dowell
High accuracy laser radiometry is on the verge of significant improvements just as new laser technologies are evolving. Our present tasks are directed toward anticipating and meeting the measurement needs in two areas; higher power and shorter wavelengths

Characterizing reliability of multilayer PZT actuators

February 26, 2006
Author(s)
Stephanie A. Hooker
Many new applications are emerging for piezoelectric ceramics including adaptive structures, active-flow-control devices, and vibration and noise suppression systems. Additionally, there are opportunities to use these devices in the biomedical field for

Method and Apparatus for Precision In-Line Sampling of Distillate

February 26, 2006
Author(s)
Thomas J. Bruno
In this short note we present a method and a simple apparatus for use with simple, fractional and steam distillation operations in which the operator requires a precise measurement of instantaneous distillate composition as the distillation proceeds. There

Guide for Developing Security Plans for Information Technology Systems

February 24, 2006
Author(s)
Marianne M. Swanson, Joan Hash, Pauline Bowen
The objective of system security planning is to improve protection of information system resources. All federal systems have some level of sensitivity and require protection as part of good management practice. The protection of a system must be documented

Cross-Display-Technology Video Motion Measurement Tools

February 23, 2006
Author(s)
John W. Roberts, Edward A. Fanning, Hassan A. Sahibzada
High performance video places severe demands on playback system and display device resources. Motion playback errors such as irregular motion playback and image breakup are common, making accurate measurement of motion critically important for device

Estimation of the Interfacial Adhesion Strength in Compositional Libraries of Epoxy Films

February 22, 2006
Author(s)
Jae Hyun Kim, Martin Y. Chiang, D Kawaguchi, Gareth Royston, Christopher M. Stafford
At the NIST Combinatorial Methods Center (NCMC), we have designed, developed, and demonstrated a combinatorial approach to the edge delamination test to char-acterize the adhesion of thin polymer films. This test is based on fracture of a film/substrate
Displaying 34726 - 34750 of 73832
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