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NIST Authors in Bold

Displaying 34576 - 34600 of 73697

Minimum Security Requirements for Federal Information and Information Systems

March 1, 2006
Author(s)
National Institute of Standards and Technology (NIST), Ronald S. Ross, Stuart W. Katzke, L A. Johnson
FIPS 200 is the second standard that was specified by the Federal Information Security Management Act (FISMA). It is an integral part of the risk management framework that the National Institute of Standards and Technology (NIST) has developed to assist

Oxidative Stress and DNA Damage-DNA Repair System in Vascular Smooth Muscle Cells in Artery and Vein Grafts

March 1, 2006
Author(s)
S. H. McLaren, D. Gao, L. Chen, J. R. Eshleman, V. Dawson, M. A. Trush, V. Bohr, M. Dizdaroglu, G. M. Williams, C. Wei
Graft failure in coronary artery bypass grafts (CABGs) utilizing the saphenous vein is significantly higher than in those utilizing the internal mammary artery (IMA) or the radial artery (RA). While a number of studies have described this phenomenon

Perceptual Study of the Impact of Varying Frame Rate on Motion Imagery Interpretability

March 1, 2006
Author(s)
Charles D. Fenimore, J Irvine, D Cannon, John W. Roberts, A Aviles, S Israel, Michelle Brennan, L Simon, J Miller, Donna Haverkamp, P F. Tighe, Michael Gross
The development of a motion imagery (MI) quality scale, akin to the National Image Interpretibility Rating Scale (NIIRS) for still imagery, would have great value to designers and users of surveillance and other MI systems. A multi-phase study has adopted

Precision Measurement Method for Cryogenic Amplifier Noise Temperatures Below 5 K

March 1, 2006
Author(s)
James P. Randa, Eyal Gerecht, Dazhen Gu, Robert L. Billinger
We report precision measurements of the effective input noise temperature of a cryogenic (liquid helium temperature) MMIC amplifier at the amplifier reference planes within the cryostat. A method is given for characterizing and removing the effect of the

Progress on Implementation of a CD-AFM Based Reference Measurement System

March 1, 2006
Author(s)
Ndubuisi G. Orji, Angela Martinez, Ronald G. Dixson, J Allgair
The National Institute of Standards and Technology (NIST) and SEMATECH are working to address traceability issues in semiconductor dimensional metrology. In semiconductor manufacturing, many of the measurements made in the fab are not traceable to the SI

Resonance-free Low-pass Filters for the ac Josephson Voltage Standard

March 1, 2006
Author(s)
Michio Watanabe, Paul Dresselhaus, Samuel Benz
We have designed and characterized superconducting integrated circuits for the ac Josephson voltage standard that demonstrate significantly improved performance. The typical circuit consists of an array of superconductor-normal metal-superconductor

Sampling-Oscilloscope Measurement of a Microwave Mixer With Single-Digit Phase Accuracy

March 1, 2006
Author(s)
Dylan F. Williams, Hassen Khenissi, Fabien Ndagijimana, Catherine A. Remley, Joel Dunsmore, Paul D. Hale, Jack Wang, Tracy S. Clement
We describe a straightforward method of separately characterizing up-conversion and down-conversion in microwave mixers with a sampling oscilloscope. The method mismatch-corrects the results, determines both magnitude and phase, and uses a novel time-base

Symmetry, Equivalence and Molecular Self-Organization

March 1, 2006
Author(s)
K Van Workum, Jack F. Douglas
Abstract: Self-organization is central to the formation of numerous biological structures and the emulation of this process through the creation of synthetic counterparts offers great promise for nanofabrication. Our approach to understanding the

Temperature Measurements of Microhotplates Using Fluorescence Thermometry

March 1, 2006
Author(s)
Christopher W. Meyer, Douglas C. Meier, Christopher B. Montgomery, Stephen Semancik
A fluorescence microscope has been constructed for measuring surface temperatures of microhotplate platforms. The microscope measures temperature-dependent fluorescence lifetimes of a film of the phosphor Mg4(F)GeO6:Mn which is deposited on the

The Calibration of Vacuum Gauges

March 1, 2006
Author(s)
Patrick J. Abbott
Vacuum gauges are used to measure pressures below the local atmospheric pressure. The success of many processes relies on an accurate vacuum pressure measurement, making calibration of vacuum gauges essential. This paper discusses the issues related to

The Limits of Image-Based Optical Metrology

March 1, 2006
Author(s)
Richard M. Silver, Bryan M. Barnes, Ravikiran Attota, Jay S. Jun, James J. Filliben, Juan Soto, Michael T. Stocker, P Lipscomb, Egon Marx, Heather J. Patrick, Ronald G. Dixson, Robert D. Larrabee
An overview of the challenges encountered in imaging device-sized features using optical techniques recently developed in our laboratories is presented in this paper. We have developed a set of techniques we refer to as scatterfield microscopy which allows

The Other Monte Carlo Method

March 1, 2006
Author(s)
Isabel M. Beichl, Francis Sullivan
This is a general article on a Monte Carlo method different from the traditional Metropolis algorithm. Sampling is done according to a non-uniform probability distribution that is generated as the choice is being made.

Three Rings of Polyhedral Simple Functions

March 1, 2006
Author(s)
James F. Lawrence
We survey three ways to multiply elements of the additive subgroup of the group of real--valued functions on Rd which is generated by the indicator functions of polyhedra. In the resulting commutative rings, identities often correspond to useful techniques

Traceable Atomic Force Microscope Dimensional Metrology at NIST

March 1, 2006
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Joseph Fu, Michael W. Cresswell, Richard A. Allen, William F. Guthrie
The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. There are two major instruments being used for traceable measurements at NIST. The first is a custom in-house

Using LADAR to characterize the 3-D shape of aggregates: Preliminary results

March 1, 2006
Author(s)
Edward J. Garboczi, Geraldine S. Cheok, William C. Stone
In previous publications, we have shown how using x-ray computed tomography to obtain the raw 3-D data for the coordinates of the surface, and then converting this raw data into an analytical function for the surface via an expansion in spherical harmonic
Displaying 34576 - 34600 of 73697
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