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Displaying 33726 - 33750 of 73830

A Low-Threshold Self-Referenced Ti:Sapphire Optical Frequency Comb

October 2, 2006
Author(s)
Matthew S. Kirchner, Tara M. Fortier, A Bartels, Scott A. Diddams
We demonstrate an octave-spanning, self-referenced optical frequency comb produced with a high repetition rate (frep=585 MHz) femtosecond Ti:Sapphire laser that requires less that 1 W of 532 nm pump power. The frequency comb was stabilized to a CW laser as

Analysis of Hexabromocyclododecane Diastereomers and Enantiomers by Liquid Chromatography Tandem Mass Spectrometry: Chromatographic Selectivity and Ionization Matrix Effects

October 2, 2006
Author(s)
Nathan G. Dodder, Aaron Peck, John R. Kucklick, Lane C. Sander
Hexabromocyclododecane (HBCD) is a flame retardant that is undergoing environmental risk assessment. The liquid chromatographic retention and electrospray ionization matrix effects were investigated for HBCD methods of analysis for environmental matrices

Combinatorial Study of Ni-Ti-Pt Ternary Metal Gate Electrodes on HfO 2 for the Advanced Gate Stack

October 2, 2006
Author(s)
Kao-Shuo Chang, Martin L. Green, John S. Suehle, Eric M. Vogel, Hao Xiong, Jason Hattrick-Simpers, Ichiro Takeuchi, O Famodu, K Ohnaka, T Chikyow, Prashant Majhi, B H. Lee, M Gardner
We have fabricated combinatorial Ni-Ti-Pt ternary metal gate thin film libraries on HfO2 using magnetron co-sputtering, to investigate flat-band voltage shift (DVfb) and leakage current density (JL) variations. Wavelength dispersive spectroscopy (WDS)

COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS AS DETERMINED BY XRD AND EBSD

October 2, 2006
Author(s)
Jens Mueller, Davor Balzar, Roy H. Geiss, David T. Read, Robert Keller
Texture in materials has a large influence on many properties of thin films; it is customarily determined by neutron or X-ray diffraction by measuring pole figures and evaluating orientation-distribution functions (ODF). X-ray diffraction (XRD) was the

Microwave Resonances in Nanogranular (Fe

October 2, 2006
Author(s)
Massimo Pasquale, Sergio Perero, Giorgio Bertotti, Pavel Kabos
We have analyzed the microwave behavior of soft nanogranular (Fe 0.7uCo 0.3u) 71uB 22uNi films with thickness of 136, 195 and 236 nm which present a dc relative permeability from 60 to 280, a resistivity of 8 to 9×10 7d Ω}m and a zero-field double

Overview of the TREC 2005 Question Answering Track

October 2, 2006
Author(s)
Ellen M. Voorhees, Hoa T. Dang
The TREC 2005 Question Answering (QA) track contained three tasks: the main question answering task, the document ranking task, and the relationship task. In the main task, question series were used to define a set of targets. Each series was about a

A Brighter Future From Gallium Nitride Nanowires

October 1, 2006
Author(s)
Kristine A. Bertness, Norman Sanford, Albert Davydov
How might nitride semiconductor nanowires change the future of computing? In the spirit of this special issue on how science fiction might become working technology, we offer some speculations and explain the science behind them. This article focuses on

A Model-Driven Approach for Building OWL DL and OWL Full Ontologies

October 1, 2006
Author(s)
S Brockmans, R Colomb, P Haase, E Kendall, Evan K. Wallace, G Xie
This paper presents an approach for visually modeling OWL DL and OWL Full ontologies based on the well-established visual modeling language UML. We discuss a metamodel for OWL based on the Meta-Object Facility, an associated UML profile as visual syntax

A New Critical Dimension Metrology for Chrome-on-Glass Substrates Based ons-Parameter Measurements Extracted from Coplanar Waveguide Test Structures

October 1, 2006
Author(s)
Chidubem Nwokoye, Mona E. Zaghloul, Michael W. Cresswell, Richard A. Allen, Christine E. Murabito
In mask fabrication, Critical Dimension (CD) metrology is conducted by optical transmission, Scanning Electron Microscopy (SEM), and Atomic Force Microscopy (AFM) tools. All these have different advantages and limitations. The work reported here is the

Advanced Metrology Needs for Nanoelectronics Lithography

October 1, 2006
Author(s)
Stephen Knight, Ronald Dixon, Ronald L. Jones, Eric Lin, Ndubuisi G. Orji, Richard M. Silver, Andras Vladar, Wen-li Wu
The semiconductor industry has exploited productivity improvements through aggressive feature size reduction for over four decades. While enormous effort has been expended in developing the optical lithography tools to print ever finer features

An Optimized Electrophoresis System for Tandem SSCP and Heteroduplex Analysis of p53 Gene Exons 5-9 on Glass Microfluidic Chips

October 1, 2006
Author(s)
Christa N. Hestekin, J P. Jakupciak, Thomas N. Chiesl, C D. O'Connell, Annelise E. Barron, C W. Kan
With the sequencing of the human genome, there is a growing need for rapid and sensitive genotyping methods that can be incorporated into the clinical setting. DNA-based methods, such as single strand conformational polymorphism (SSCP) and heteroduplex

Anisotropy of Magnetization Reversal and Magnetoresistance in Square Arrays of Permalloy Nano-Rings

October 1, 2006
Author(s)
A Goncharov, A Zhukov, V Metlushko, G Bordignon, H Fangohr, C de Groot, John Unguris, Willard C. Uhlig, G Karapetrov, B Ilic, P A. de Groot
Magnetization reversal mechanisms and the impact of magnetization direction are studied in square arrays of interconnected circular permalloy nanorings using magnetooptical Kerr effect, local imaging, numerical simulations, and transport techniques
Displaying 33726 - 33750 of 73830
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