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Thickness dependence of microstructure in semiconducting films of an oligofluorene derivative

Published

Author(s)

Dean M. DeLongchamp, M -. Ling, Yeon-Gil Jung, Daniel A. Fischer, M E. Roberts, Eric K. Lin, Zhenan Bao
Citation
Journal of the American Chemical Society
Volume
128
Issue
51

Citation

DeLongchamp, D. , Ling, M. , Jung, Y. , Fischer, D. , Roberts, M. , Lin, E. and Bao, Z. (2006), Thickness dependence of microstructure in semiconducting films of an oligofluorene derivative, Journal of the American Chemical Society, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854339 (Accessed February 23, 2024)
Created December 27, 2006, Updated February 19, 2017