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Displaying 33526 - 33550 of 74026

Synchrotron Radiation Based Irradiance Calibration From 200 nm to 400 nm at SURF III

January 1, 2007
Author(s)
Uwe Arp, Charles E. Gibson, Keith R. Lykke, Albert C. Parr, Robert D. Saunders, D J. Shin, Ping-Shine Shaw, Zhigang Li, Howard W. Yoon
A new facility for measuring source irradiance was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility (SURF III) as the primary

Technology and Metrology of New Electronic Materials and Devices

January 1, 2007
Author(s)
Eric M. Vogel
Scaling of the complementary metal oxide semiconductor (CMOS) field effect transistor (FET) and its traditional materials has been the basis of the semiconductor industry for nearly 30 years. Traditional materials such as SiO2 gate dielectrics and

Testing and Monitoring E-Business Using the Event-Driven Test Scripting Language

January 1, 2007
Author(s)
Boonserm Kulvatunyou, J Durand, Jungyub Woo, M Martin
This paper addresses challenges associated with conformance and interoperability testing of today's e-business technologies and proposes a new approach that improves on existing, test scripting languages and operation modes. A test model and scripting are
Displaying 33526 - 33550 of 74026
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