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Displaying 33301 - 33325 of 73830

Report of the Workshop on Reliability Issues in Nanomaterials

January 1, 2007
Author(s)
Robert Keller, David T. Read, Roop L. Mahajan
The Workshop on Reliability Issues in Nanomaterials was held at the Boulder Laboratories of the U. S. Department of Commerce on August 17-19, 2004. It was organized by the National Institute of Standards and Technology (NIST) and was designed to promote a

Results of a Nanoindentation Round Robin on Thin Film Copper on Silicon

January 1, 2007
Author(s)
David T. Read, Robert Keller, Nicholas Barbosa, Roy H. Geiss
Nanoindentation is used in a variety of fields to measure material hardness and elastic modulus. This test technique is especially attractive for thin films because of the difficulty of conducting tensile or other conventional mechanical characterization

Rheology of Concentrated Carbon Nanotube Suspensions

January 1, 2007
Author(s)
K HobbieE, J FryD
The rheological properties of non-Brownian carbon nanotube suspensions are measured over a range of nanotube volume fractions spanning the transition from semi-dilute to concentrated. The nanotubes are `sticky' and form a quiescent elastic network with a

Roundness Measurements Using the NIST Fiber Probe

January 1, 2007
Author(s)
Balasubramanian Muralikrishnan, Jack A. Stone Jr., John R. Stoup
We have described a fiber probe for dimensional measurement of micro-holes in the 2004 and 2006 ASPE annual meetings. In this abstract, we describe the adaptation of this probe for measuring roundness of tiny holes and knife edge apertures. In its current

SEMPA Imaging for Spintronics Applications

January 1, 2007
Author(s)
John Unguris, Daniel T. Pierce, Seok-Hwan Chung
Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by
Displaying 33301 - 33325 of 73830
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