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Displaying 33051 - 33075 of 73697

Images of Strips On and Trenches In Substrates

January 1, 2007
Author(s)
Egon Marx
The computation of images of lines or strips on a substrate and trenches in a substrate or a layer above a substrate, all made of dielectric or absorbing materials, using integral equations equivalent to Maxwell's equations and using Fourier optics are

Information Security Guide for Government Executives

January 1, 2007
Author(s)
Pauline Bowen, Elizabeth Chew, Joan Hash
Information Security Guide for Government Executives provides a broad overview of information security program concepts to assist senior leaders in understanding how to oversee and support the development and implementation of information security programs

Laser Tracker Testing at NIST Using the ASME B89.4.19 Standard

January 1, 2007
Author(s)
Balasubramanian Muralikrishnan, Christopher J. Blackburn, Daniel S. Sawyer, Bruce R. Borchardt, William T. Estler, Steven D. Phillips
While the versatility and economics of laser trackers are quite appealing, the ability to assess their accuracy and to compare various brands has been limited by a lack of a national or international standard that encompasses testing and traceability

Laser Trackers: Testing and Standards

January 1, 2007
Author(s)
Steven D. Phillips
Laser trackers are now the tool of choice for large scale coordinate metrology. They are transportable allowing reconfigurable production facilities at a lower capital cost than large CMMs. Trackers now include absolute distance measuring (ADM) capability
Displaying 33051 - 33075 of 73697
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