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Displaying 32976 - 33000 of 73697

Development of Certified Reference Materials of Ion-Implanted Dopants in Silicon for Calibration of Secondary Ion Mass Spectrometers

January 1, 2007
Author(s)
David S. Simons, Robert G. Downing, George P. Lamaze, Richard M. Lindstrom, Robert R. Greenberg, Rick L. Paul, Susannah Schiller, William F. Guthrie
Certified reference materials have been developed for calibration of the concentrations of the most common dopants used in silicon semiconductor technology boron, arsenic, and phosphorus. These materials consist of a single dopant species that is

Effect of Surface Properties on Wrinkling of Ultrathin Films

January 1, 2007
Author(s)
Rui Huang, Christopher Stafford, B D. Vogt
Thin films bonded to compliant substrates often develop wrinkles when subjected to an applied or inherent compressive stress. This paper presents a bilayer model to account for surface effects on the wrinkling of ultrathin solid films. Assuming a surface

Effects of DCPA Nano-Particle Filler Level on Ca-and-PO 4- Releasing Dental Composites

January 1, 2007
Author(s)
Hockin D. Xu, Michael Weir, Limin Sun, S. Takagi, Laurence C. Chow
Dicalcium phosphate anhydrous (DCPA) nano-particles were recently synthesized. The objective of this study was to investigate the effects of filler level on composite mechanical properties and Ca and PO4 release. Nano DCPA and whiskers were used at DCPA
Displaying 32976 - 33000 of 73697
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