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Displaying 32001 - 32025 of 74348

Peridynamic Simulation of Electromigration

January 1, 2008
Author(s)
David T. Read, Walter Gerstle, Stewart Silling, Vinod K. Tewary, Richard Lehoucq
A theoretical framework, based upon the peridynamic model, is presented for analytical and computational simulation of electromigration. The framework allows four coupled physical processes to be modeled simultaneously: mechanical deformation, heat

Physics Laboratory:

January 1, 2008
Author(s)
Jonathan E Hardis, Jonathan E Hardis, William R Ott

Required Safe Egress Time: Data and Modeling

January 1, 2008
Author(s)
Jason D. Averill, Paul A. Reneke, Richard D. Peacock
This paper identifies sources of uncertainty in RSET (required safe egress time) calculations, with focus on data and modeling. A model for efficiently calculating the range of egress solutions for a particular design is presented. Three recommendations
Displaying 32001 - 32025 of 74348
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