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NIST Authors in Bold

Displaying 31826 - 31850 of 74483

Uncertainty Analysis for NIST Noise-Parameter Measurements

March 31, 2008
Author(s)
James P. Randa
The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the

Guide for the Use of the International System of Units (SI)

March 30, 2008
Author(s)
Ambler Thompson, Barry N. Taylor
This 2007 edition of SP811 updates International System of Units (SI) usage as implemented in the 8th edition of the SI Brochure, incorporates a significant amount of additional material intended to answer frequently asked questions concerning the SI and

Torsion rotation global analysis of the first three torsional states (mt = 0, 1, 2) and terahertz database for methanol

March 30, 2008
Author(s)
Jon T. Hougen, Li-Hong Xu, Jonathan M. Fisher, H. Y. Shi, J C. Pearson, Brian J. Drouin, G A. Blake, R. Braakman
Stimulated by recent THz measurements of the methanol spectrum in one of our laboratories, undertaken in support of NASA programs related to the Herschel Space Observatory (HSO) and the Atacama Large Millimeter Array (ALMA), we have carried out a global

Characterizing Pattern Structures Using X-Ray Reflectivity

March 28, 2008
Author(s)
Hae-Jeong Lee, Christopher L. Soles, Hyun Wook Ro, Shuhui Kang, Eric K. Lin, Alamgir Karim, Wen-Li Wu
Specular X-ray reflectivity (SXR) can be used, in the limit of the effective medium approximation (EMA), as a high-resolution shape metrology for periodic patterns on a planar substrate. The EMA means that the density of the solid pattern and the space

Sr Lattice Clock at 1 x 10 -16 Fractional Uncertainty by Remote Optical Evaluation with a Ca clock

March 28, 2008
Author(s)
A D. Ludlow, T Zelevinsky, G K. Campbell, S Blatt, M M. Boyd, M de Miranda, M J. Martin, S M. Foreman, J Ye, Tara M. Fortier, Jason Stalnaker, Scott A. Diddams, Yann LeCoq, Zeb Barber, Nicola Poli, Nathan D. Lemke, K. Beck, Christopher W. Oates
Optical atomic clocks promise timekeeping at the highest precision and accuracy, owing to their high operating frequency. The most accurate optical clocks are presently based on single trapped ions1, due to the exquisite control possible over their

A Two-Tier Bloom Filter to Achieve Faster Membership Testing

March 27, 2008
Author(s)
Miguel Jimeno, K Christensen, Allen L. Roginsky
Testing for element membership in a Bloom Filter requires hashing of a test element (e.g., a string) and multiple look-ups in memory. A design of a new two-tier Bloom filter with on-chip hash functions and cache is described. For elements with a heavy

Handling Computer Security Incidents: NIST Issues Updated Guidelines

March 27, 2008
Author(s)
Shirley M. Radack
This bulletin summarizes information disseminated in revised NIST Special Publication (SP) 800-61-1, Computer Security Incident Handling Guide: Recommendations of the National Institute of Standards and Technology. Written by Karen Scarfone and Tim Grance

Long Term Sustainment Workshop Report

March 26, 2008
Author(s)
Joshua Lubell, Mahesh Mani, Eswaran Subrahmanian, Sudarsan Rachuri
This report summarizes the presentations, discussions and recommendations of a workshop held at the National Institute of Standards and Technology (NIST) on April 24-25, 2007. The purpose of the workshop was to identify policies of digital preservation and

Programs of the Manufacturing Engineering Laboratory (2005 - 2008)

March 26, 2008
Author(s)
Lisa J. Fronczek, Bessmarie A. Young
The National Institute of Standards and Technology s Manufacturing Engineering Laboratory (MEL) promotes innovation and the competitiveness of U.S. manufacturing through measurement science, measurement services, and critical technical contributions to

Line Width Roughness and Cross Sectional Measurements of Sub-50 nm Structures with CD-SAXS and CD-SEM

March 24, 2008
Author(s)
Chengqing C. Wang, Ronald L. Jones, Kwang-Woo Choi, Christopher L. Soles, Eric K. Lin, Wen-Li Wu, James S. Clarke, John S. Villarrubia, Benjamin Bunday
Critical dimension small angle x-ray scattering (CD-SAXS) is a measurement platform which is capable of measuring the average cross section and sidewall roughness in patterns ranging from (10 to 500) nm in pitch with sub nm precision. These capabilities

The TREC 2006 Terabyte Track

March 24, 2008
Author(s)
Stefan Buttcher, Charles L. Clarke, Ian Soboroff
The primary goal of the Terabyte Track is to develop an evaluation methodology for terabyte-scale document collections. In addition, we are interested in efficiency and scalability issues, which can be studied more easily in the context of a larger

Towards Accurate Feature Shape Metrology

March 22, 2008
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, B Bunday, J Allgair
Over the last few years, the need for shape metrology for process control has increased. A key component of shape metrology is sidewall angle (SWA). However, few instruments measure SWA directly. The critical dimension atomic force microscope (CD-AFM) is

Narrow-Line Magneto-Optical Cooling and Trapping of Strongly Magnetic Atoms

March 21, 2008
Author(s)
Andrew J. Berglund, James L. Hanssen, Jabez J. McClelland
We trap and cool erbium atoms in a quadrupole magnetic field using a stabilized laser tuned to the blue side of a narrow (8 kHz) atomic resonance. Cooling and trapping are observed with a single incident beam, as well as with multiple beams. The trap forms

A Computational Model of the Human Visual Cortex

March 20, 2008
Author(s)
James S. Albus
The brain is first and foremost a control system that is capable of building an internal representation of the external world, and using this representation to make decisions, set goals and priorities, formulate plans, and control behavior with intent to

Aluminum UPD and Alloy Formation on (111)-Textured Au in AlCl_{3}-EMImCl

March 20, 2008
Author(s)
Gery R. Stafford, G Haarberg
The kinetics of Al-Au surface alloy formation was examined during Al underpotential deposition (upd) onto (111)-texture Au from Lewis acidic aluminum chloride-1-ethyl-3-methlimidazolium chloride (AlCl_{3}-EMImCl)using linear sweep stripping voltammetry

Performance Analysis for Stable Mobile Robot Navigation Solutions

March 20, 2008
Author(s)
Christopher J. Scrapper Jr, Rajmohan Madhavan, Stephen B. Balakirsky
Robot navigation in complex, dynamic and unstructured environments demands robust mapping and localization solutions. One of the most popular methods in recent years has been the use of scan-matching schemes where temporally correlated sensor data sets are

ASTM E-57 3D Imaging Systems Committee: An Update

March 19, 2008
Author(s)
Alan M. Lytle, Geraldine S. Cheok, Kamel S. Saidi
In 2006, ASTM committee E57 was established to develop standards for the performance evaluation of 3D imaging systems. The committee's initial focus is on standards for 3D imaging systems typically used for applications including, but not limited to
Displaying 31826 - 31850 of 74483
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