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Displaying 31476 - 31500 of 73929

Mitochondrial Genome Deletion Aids in the Identification of Both False and True Negative Prostate Needle Core Biopsies

January 6, 2008
Author(s)
Jennifer Maki, Kerry Robinson, Brian Reguly, Jude Alexander, Roy Wittock, A A. Aguirre, Eleftherios Diamandis, Nicholas Escott, Anthony Skehan, Owen Prowse, Robert E. Thayer, Kent Froberg, Michael Wilson, Samantha D. Maragh, J P. Jakupciak, Paul D. Wagner, S Srivastava, Gabriel D. Dakubo, Ryan L. Parr
We report the utility of a 3.4kb mtgenome deletion (3.4mt?) for molecular definition of benign, malignant and proximal to malignant (PTM) needle biopsies. The 3.4mt_ was identified through long extension PCR analysis of frozen PCa samples. A quantitative

High-performance carbon nanotube coatings for high-power laser radiometry

January 3, 2008
Author(s)
Krishna Ramadurai, Christopher L. Cromer, Laurence A. Lewis, Katie Hurst, Anne Dillon, Roop Mahajan, John H. Lehman
Radiometry for the next generation of high-efficiency, high-power industrial lasers requires thermal management at optical power levels exceeding 10 kW. Laser damage and thermal transport present fundamental challenges for laser radiometry in support of

Announcement: Greetings from the New Co-Editors

January 2, 2008
Author(s)
Allan H. Harvey, Donald R. Burgess Jr.
This is an editorial from the two incoming editors of the Journal of Physical and Chemical Reference Data, describing their future plans.

Coherent, multiheterodyne spectroscopy using stabilized optical frequency combs

January 2, 2008
Author(s)
Ian R. Coddington, William C. Swann, Nathan R. Newbury
The broadband, coherent nature of narrow-linewidth fiber frequency combs is exploited to measure the full complex spectrum of a molecular gas through multiheterodyne spectroscopy. We measure the absorption and phase shift experienced by each of 155 000

Optical Critical Dimension Measurement of Silicon Grating Targets Using Back Focal Plane Scatterfield Microscopy

January 2, 2008
Author(s)
Heather J. Patrick, Ravikiran Attota, Bryan M. Barnes, Thomas A. Germer, Michael T. Stocker, Richard M. Silver, Michael R. Bishop
We demonstrate optical critical dimension measurement of lines in silicon grating targets using back focal plane scatterfield microscopy. In this technique, angle-resolved diffraction signatures are obtained from grating targets by imaging the back focal

Raman Spectroscopic Determination of Hole Concentration in p-Type GaSb

January 2, 2008
Author(s)
James E. Maslar, Wilbur S. Hurst, C Wang
Room temperature p-type GaSb bulk coupled mode spectra were measured as a function hole concentration. These spectra were obtained using an optical system based on 752.55 nm excitation in order to obtain more sensitivity to bulk GaSb coupled mode

Standard Guide to Fluorescence - Instrument Calibration and Validation

January 2, 2008
Author(s)
Paul C. DeRose
This guide is intended to aid in the calibration, qualification and performance verification of fluorescence-based instrumentation as part of complying with regulatory and other QA/QC requirements. Commonly-used, commercially available materials and

Standard Reference Materials Catalog January 2008

January 2, 2008
Author(s)
Regina R. Montgomery, Joan C. Sauerwein
NIST Standard Reference materials (SRMs) are used by industry, government and academia to ensure the highest quality measurements. This catalog lists over 1300 individual reference materials produced and sold, by NIST, each with carefully assigned values

0:45 Surface Color

January 1, 2008
Author(s)
Maria E. Nadal, E A. Early, Robert R. Bousquet
This document, SP250-71 (2007), NIST Measurements Services: 0:45 Surface Color, describes the instrumentation, standards, and techniques used to measure the surface color of reflective, non-fluorescent materials at a 0:45 geometry, that is an irradiance
Displaying 31476 - 31500 of 73929
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