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NIST Authors in Bold

Displaying 31326 - 31350 of 73697

Guide to SSL VPNs:

January 1, 2008
Author(s)
S E Frankel, P Hoffman, A D Orebaugh, R Park

High Temperature Electrical Resistance of substrate-supported Single Walled Carbon Nanotubes

January 1, 2008
Author(s)
Richard E. Cavicchi, C Avedisian, Paul M. McEuen, Xinjian Zhou, Wilbur S. Hurst, Joseph T. Hodges
We report the electrical characteristics of two substrate-supported metallic single walled carbon nanotubes (SWNT) at temperatures up to 573 K over a range of bias voltages for zero gate voltage in air under atmospheric pressure. At low voltages or high

Holmium Oxide Glass Wavelengths Standards

January 1, 2008
Author(s)
David W. Allen
Holmium oxide glass has been used as a wavelength standard for over four decades. These standards have shown very little variation from batch to batch and from one manufacturer to another. NIST has certified and recertified holmium oxide glass samples for

In Situ Gas Phase Diagnostics for Hafnium Oxide Atomic Layer Deposition

January 1, 2008
Author(s)
James E. Maslar, Wilbur S. Hurst, Donald R. Burgess Jr., William A. Kimes, Nhan V. Nguyen, Elizabeth F. Moore, Joseph T. Hodges
Atomic layer deposition (ALD) is an important method for depositing the nanometer-scale, conformal high  dielectric layers required for many nanoelectronics applications. In situ monitoring of ALD processes has the potential to yield insights that will

Integrating Sensors and Actuators into RFID Tags

January 1, 2008
Author(s)
Kang B. Lee, J T. Cain
The objective in this chapter is to present the current situation in RFID systems and networked transducers and to indicate the strategy that is taken and research that will be necessary to incorporate ?smart? sensors and actuators into existing RFID tags
Displaying 31326 - 31350 of 73697
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