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NIST Authors in Bold

Displaying 30376 - 30400 of 73697

Charpy Machine Verification: Limits and Uncertainty

September 1, 2008
Author(s)
Jolene Splett, Christopher N. McCowan, Chih-Ming Wang
The purpose of this document is to clarify some issues pertaining to uncertainty statements and the ASTM E 23 limits used in the Charpy machine verification program. We explain some of the distributional subtleties associated with uncertainty and

Cold Chain Storage of Vaccines: A Brief Introduction to Thermometry

September 1, 2008
Author(s)
Dean C. Ripple
To maintain the efficacy of vaccines requires maintaining the storage temperature within well-defined limits; vaccine failure due to improper storage results in large direct and indirect public health costs. In this presentation, I give a brief

High power laser calibrations at NIST

September 1, 2008
Author(s)
Xiaoyu X. Li, Joshua A. Hadler, Christopher L. Cromer, John H. Lehman, Marla L. Dowell
This document describes the calibration service for the responsivity of laser power meters and detectors used with continuous wave high power lasers at laser wavelengths of 1.06 and 10.6 micrometers. An overview of the calibration procedures, measurement

Improved Performance of Schottky Diodes on Pendeo-Epitaxial Gallium Nitride

September 1, 2008
Author(s)
Lawrence H. Robins, T Zheleva, M Derenge, D Ewing, P Shah, K Jones, U Lee
We designed experiments to investigate the role of the dislocation density on the performance of Schottky diodes fabricated on GaN material grown conventionally and by pendeo-epitaxy. Devices of varying geometries were fabricated on the low defect density

Method to Determine Collection Efficiency of Particles by Swipe Sampling

September 1, 2008
Author(s)
Jennifer R. Verkouteren, Jessica L. Staymates, Robert A. Fletcher, Wayne Smith, George A. Klouda, John G. Gillen
A methodology was developed to evaluate particle collection efficiencies from swipe sampling of trace residues. Swipe sampling is used for many applications where trace residues must be collected, including the evaluation of radioactive particle

Modeling of Photochemical Reactions in a Focused Laser Beam, II

September 1, 2008
Author(s)
Adolfas K. Gaigalas, Fern Y. Hunt, Lili Wang
A method is described for obtaining rate constants of photodegradation process of fluorophores illuminated by a focused laser beam. The explicit kinetic equations, describing the population dynamics of excited singlet and triplet states, are averaged over

Modeling the Effect of Finite Size Gratings on Scatterometry Measurements

September 1, 2008
Author(s)
Elizabeth Kenyon, Michael W. Cresswell, Heather Patrick, Thomas Germer
The interpretation of scatterometry measurements generally assumes that the grating extends over an area large enough to intercept all the illumination provided by an incident beam. However, in practice, the gratings used in scatterometry are relatively

New Insight into NBTI Transient Behavior Observed from Fast-GM Measurements

September 1, 2008
Author(s)
Jason P. Campbell, Kin P. Cheung, John S. Suehle
Fast-IDVG measurements have become an increasingly important tool to examine MOSFET transient degradation. The threshold voltage (VTH) extracted from fast-IDVG measurements is often used to infer the transient behavior of trapped charged in the gate

NIST Tests of the Wireless Environment in Automobile Manufacturing Facilities

September 1, 2008
Author(s)
Catherine A. Remley, Galen H. Koepke, Chriss A. Grosvenor, John M. Ladbury, Dennis G. Camell, Jason B. Coder, Robert Johnk
This report describes tests carried out by members of the NIST Electromagnetics Division to study the wireless environment in automotive manufacturing facilities. Testing was performed at three facilities during 2006 and 2007. We studied an assembly plant

Quantification of Hydroxyl Content in Ceramic Oxides: A PGAA Study of BaTiO3

September 1, 2008
Author(s)
Rick L. Paul, Vahit Atakan, Chun-Wei Chen, Richard E. Riman
Thermo-gravimetric analysis (TGA) and Fourier Transform Infrared Spectroscopy (FTIR) techniques for water content determination were compared with a neutron characterization technique, Prompt Gamma Activation Analysis (PGAA). Residual H content of the

Refining the In-Parameter-Order Strategy for Constructing Covering Arrrays

September 1, 2008
Author(s)
Michael Forbes, James F. Lawrence, Yu Lei, Raghu N. Kacker, D. Richard Kuhn
Covering arrays are structures for well-representing extremely large input spaces and are used to efficiently implement blackbox testing for software and hardware. This paper proposes refinements over the In-Parameter-Order strategy (for arbitrary $t$)

Status of NIST Thermal Insulation Reference Materials

September 1, 2008
Author(s)
Robert R. Zarr
The current status of thermal insulation reference materials at the National Institute of Standards and Technology (NIST) is presented. This paper describes an ongoing thermal insulation measurement program that provides the public with Calibrated Transfer

Through-focus Scanning and Scatterfield Optical Methods for Advanced Overlay Target Analysis

September 1, 2008
Author(s)
Ravikiran Attota, Michael T. Stocker, Richard M. Silver, Nathanael A. Heckert, Hui Zhou, Richard J. Kasica, Lei Chen, Ronald G. Dixson, Ndubuisi G. Orji, Bryan M. Barnes, Peter Lipscomb
In this paper we present overlay measurement techniques that use small overlay targets for advanced semiconductor applications. We employ two different optical methods to measure overlay using modified conventional optical microscope platforms. They are
Displaying 30376 - 30400 of 73697
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