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Search Publications

NIST Authors in Bold

Displaying 25126 - 25150 of 73697

An Introduction to the Good, the Bad, & the Ugly Face Recognition Challenge Problem

March 10, 2011
Author(s)
P J. Phillips, J. R. Beveridge, Bruce A. Draper, Geof H. Givens, Alice J. O'Toole, David Bolme, Joseph Dunlop, Yui M. Lui, Hassan A. Sahibzada, Samuel Weimer
The Good, the Bad, & the Ugly Face Challenge Problem was created to encourage the development of algorithms that are robust to recognition across changes in illumination that occur in still frontal faces. The Good, the Bad, & the Ugly consists of three

Comparison of 4.5 kV SiC JBS and Si PiN Diodes for 4.5 kV Si IGBT Anti-parallel Diode Applications

March 10, 2011
Author(s)
Tam H. Duong, Allen R. Hefner Jr., Karl Hobart, Sei-Hyung Ryu, David Grider, David W. Berning, Jose M. Ortiz, Eugene Imhoff, Jerry Sherbondy
A new 60 A, 4.5 kV SiC JBS diode is presented and its performance is compared to Si PiN diodes used as the anti-parallel diode for 4.5 kV Si IGBTs. The current-voltage, capacitance-voltage, reverse recovery, and reverse leakage characteristics of both

Coupled quantized mechanical oscillators

March 10, 2011
Author(s)
Kenton R. Brown, Christian Ospelkaus, Yves Colombe, Andrew C. Wilson, Dietrich G. Leibfried, David J. Wineland
The harmonic oscillator is one of the simplest physical systems but also one of the most fundamental. It is ubiquitous in nature, often serving as an approximation for a more complicated system or as a building block for larger models. Realizations of

Dehydrogenation Tuning of Ammine Borohydrides using Double-Metal Cations

March 10, 2011
Author(s)
Yanhui Guo, Hui Wu, Wei Zhou, Xuebin Yu
The strategy of using double-cation to tune the temperature and purity of dehydrogenation of ammine borohydrides is reported. The first double-cation ammine borohydride, Li 2Al(BH 4) 5¿6NH 3, which forms a novel structure with ordered arrangement of Al(NH

Demographic Effects on Estimates of Automatic Face Recognition Performance

March 10, 2011
Author(s)
Alice J. O'Toole, P. Jonathon Phillips, Xiaobo An, Joseph Dunlop
The intended applications of automatic face recognition systems include venues that vary widely in demographic diversity. Formal evaluations of algorithms do not commonly consider the effects of population diversity on performance. We document the effects

Empirical Evidence for Increased False Reject Rate with Time Lapse in ICE 2006

March 10, 2011
Author(s)
Sarah E. Baker, Patrick J. Flynn, Kevin W. Bowyer, P. Jonathon Phillips
We present results of the first systematic study to investigate the degree to which template aging occurs for iris biometrics. Our experiments use an image data set with approximately four years of elapsed time between the earliest and most recent images

Introduction to special issue on single-photon technologies

March 10, 2011
Author(s)
Alan L. Migdall, Sergey V. Polyakov, Jingyun Fan, Ivo P. Degiovanni, Jessica Cheung
This special issue accompanies the 4th international conference on single-photon technologies held at the National Institute of Standards and Technology (NIST) Boulder in November 2009. This community has met every two years at national metrology

NIST Measurement Services: Regular Spectral Transmittance

March 10, 2011
Author(s)
David W. Allen, Edward A. Early, Benjamin K. Tsai, Catherine C. Cooksey
This document describes measurement services, instrumentation, and measurement techniques for regular spectral transmittance over the spectral range from 250 nm to 2500 nm at the National Institute of Standards and Technology. Section 2 explains the basic

Nodal Analysis Estimates of Fluid Flow from the BP Macondo MC252 Well

March 10, 2011
Author(s)
George Guthrie, Rajesh Pawar, Curt Oldenburg, Todd Weisgraber, Grant Bromhal, Phil Gauglitz, John Bernardin, David Dixon, Rick Kapernick, Bruce Letellier, Brett Okhuysen, Robert Reid, Barry M. Freifeld, Karsten Pruess, Lehua Pan, Stefan Finsterle, George J. Moridis, Matthew T. Reagan, Thomas A. Buscheck, Christopher M. Spadaccini, Roger D. Aines, Brian Anderson, Robert Enick, Roy Long, Shahab Mohaghegh, Bryan Morreale, Neal Sams, Doug Wyatt, L A. Mahoney, J A. Bamberger, J Blanchard, J Bontha, C W. Enderlin, J A. Fort, P A. Meyer, Y Onishi, D M. Pfund, D R. Rector, M L. Stewart, B E. Wells, S T. Yokuda, Antonio Possolo, William F. Guthrie, Pedro I. Espina
The Nodal-Analysis Team within the Flow Rate Technical Group predicted the flow-related pressure drops from the reservoir to release points to estimate flow rates for various time periods for the Macondo well. These estimates were based on predictions from

Circuit cavity electromechanics in the strong-coupling regime

March 9, 2011
Author(s)
John Teufel, Dale Li, Michael S. Allman, Katarina Cicak, Adam Sirois, Jed D. Whittaker, Raymond Simmonds
Demonstrating and exploiting the quantum nature of macroscopic mechanical objects would help us to investigate directly the limitations of quantum-based measurements and quantum information protocols, as well as to test long-standing questions about

Geographic Differences in Organic Contaminants and Stable Isotopes (d13C, d15N) in Thick-billed Murre (Uria lomvia) Eggs from Alaska

March 9, 2011
Author(s)
Stacy S. Schuur, Russell D. Day, Paul R. Becker, Rebecca S. Pugh, Michael B. Ellisor, Keith A. Hobson, David G. Roseneau
Thick-billed murre (Uria lomvia) eggs were collected from four Alaskan colonies in 2002. The contents were analyzed for organic contaminants and carbon (δ13C) and nitrogen (δ15N) stable isotopes. Contaminant concentrations in eggs varied from below

Improving Face Recognition Technology

March 9, 2011
Author(s)
P J. Phillips
US-government sponsored evaluations and challenge problems have helped spur over two-orders-of-magnitude improvement in face recognition system performance.

When High-Quality Face Images Match Poorly

March 9, 2011
Author(s)
J. R. Beveridge, P. Jonathon Phillips, Geof H. Givens, Bruce A. Draper, Mohammad N. Teli, David Bolme
In face recognition, quality is typically thought of as a property of individual images, not image pairs. The implicit assumption is that high-quality images should be easy to match to each other, while low quality images should be hard to match. This

Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment

March 8, 2011
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Aaron Cordes, Benjamin Bunday, John Allgair
A key requirement for nano-manufacturing is maintaining acceptable traceability of measurements performed to determine size. Given that properties and functionality at the nanoscale are governed by absolute size, maintaining the traceability of dimensional

Merging Machining and Measurement for Cognitive Manufacturing

March 8, 2011
Author(s)
Fiona Zhao, Frederick M. Proctor, John A. Horst, Xun W. Xu
Machining process planning and measurement process planning have long received research attention from industry and academia. Machining and measurement process automation is well established for mass production in today's manufacturing systems. However

Up-conversion Single-photon Detector Using Multi-wavelength Sampling Techniques

March 8, 2011
Author(s)
Lijun Ma, Joshua Bienfang, Oliver T. Slattery, Xiao Tang
The maximum achievable data-rate of a quantum communication system can be critically limited by the efficiency and temporal resolution of the system s single-photon detectors. Frequency up-conversion technology can be used to increase detection efficiency
Displaying 25126 - 25150 of 73697
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