U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 1176 - 1200 of 1947

Prototype system for superconducting quantum interference device multiplexing of large-format transition-edge sensor arrays

September 25, 2003
Author(s)
Carl D. Reintsema, Joern Beyer, Sae Woo Nam, Steven Deiker, Gene C. Hilton, Kent D. Irwin, Joel N. Ullom, Leila R. Vale, Michael MacIntosh
We discuss the implementation of a time-division SQUID multiplexing system for the instrumentation of large-format transition-edge sensors (TES) arrays. We cover design and integration issues concerning cryogenic SQUID multiplexers and amplifiers, signal

Electrical and Optical Properties of GaN/Al 2 O 3 Interfaces

December 1, 2002
Author(s)
D C. Look, R L. Jones, X L. Sun, L J. Brillson, J W. Ager, S S. Park, J H. Han, R J. Molnar, James E. Maslar
Hall-effect, photoluminescence (PL), cathodoluminescence (CL), and Raman scattering measurements have been used to characterize the Ga (top) and N (bottom) faces of freestanding GaN layers grown by hydride vapor phase epitaxy on Al2O3. The material near

Worldwide Comparisons of Rockwell Hardness Scales that Use a Diamond Indenter

July 1, 2002
Author(s)
Samuel R. Low III, Jun-Feng Song
The United States has participated in two major worldwide comparisons of Rockwell hardness scales over the past twenty years. In 1983, fourteen countries participated in a comparison of the Rockwell C scale. The latest worldwide comparison was completed in

Ballistic Magnetoresistance in a Nanocontact Between a Ni Cluster and a Magnetic Thin Film

October 1, 2001
Author(s)
M Munoz, G G. Qian, N Karar, H. Cheng, I G. Saveliev, N Garcia, Thomas P. Moffat, P J. Chen, L Gan, William F. Egelhoff Jr.
We present measurements of ballistic magnetoresistance in nanocontacts grown by electrodeposition of Ni microclusters on magnetic thin films covered by aluminum oxide layers, using a technique proposed by Schad, et al. The measurements are made on a single

Introduction to ISO 10303 - the STEP Standard for Product Data Exchange

March 1, 2001
Author(s)
Mike Pratt
Since 1984 the International Organization for Standardization (ISO)has been working on the development of a comprehensive standard for the electronic exchange of product data between computer-based product life-cycle systems. Initial concentration has been

Length and Dimensional Measurements at NIST

February 1, 2001
Author(s)
Dennis A. Swyt
This paper reports on the past, present, and future of length and dimensional measurements at NIST. It covers the evolution of the SI unit of length through its three definitions and the evolution of NBS-NIST dimensional measurement from early linescales

Lasers, Ultrafast Pulse Technology

January 1, 2001
Author(s)
Tracy S. Clement, Scott Diddams, David J. Jones
Ultrafast pulse technology refers to the generation and use of laser pulses with durations in the femtosecond range. These ultrafast pulses are useful for a variety of applications ranging from the scientific study of very fast chemical and biological

Length and Dimensional Measurement at NIST

January 1, 2001
Author(s)
Dennis A. Swyt
This paper reports on the past, present, and future of length and dimensional measurements at NIST. It covers the evolution of the SI unit of length through its three definitions and the evolution of NBS-NIST dimensional measurement from early linescales

Introduction to ISO 10303 - The STEP Standard for Product Data Exchange

November 1, 2000
Author(s)
Mike Pratt
Since 1984 the International Organization for Standardization (ISO) has been working on the development of a comprehensive standard for the electronic exchange of product data between computer-based product life-cycle systems. Initial concentration has

Multidetector Hemispherical Polarized Optical Scattering Instrument

July 1, 1999
Author(s)
Thomas A. Germer
A multidetector optical scattering instrument is described and characterized. The instrument has twenty-eight detectors surrounding and substantially covering the scattering hemisphere. Each detector contains a polarizer so that each is only sensitive to p

Workspace Variation of a Hexapod Machine Tool

March 1, 1998
Author(s)
J Conti, C Clinton, Li Zhang, Albert J. Wavering
A method is presented to evaluate the workspace variation of a Stewart platform based machine tool. Three sets of constraints, covering strut lengths, platform and base spherical joint angles, and strut collisions, are formulated using inverse kinematics

NIST Manufacturing Process Planning and CAME Forum Workshop

January 1, 1998
Author(s)
Mike Smith, Swee K. Leong, William Regli
This workshop brought together participants from the earlier workshops held as part of the Process Planning Workshop Series and previous technical meetings of the CAME Forum. The two-day workshop was designed to promote interaction and sharing among

DNA Mixture Interpretation: A NIST Scientific Foundation Review

December 18, 2024
Author(s)
John Butler, Hariharan Iyer, Richard Press, Melissa Taylor, Peter Vallone, Sheila Willis
Improvements in DNA testing methods have allowed forensic scientists to reduce the quantity of DNA required for profiling an individual. Today, DNA profiles can be generated from a few skin cells. This increased sensitivity has extended the usefulness of

Report on High Energy Arc Fault Experiments: Experimental Results from Medium Voltage Electrical Enclosures

November 29, 2021
Author(s)
Gabriel Taylor, Anthony D. Putorti Jr., Scott Bareham, Edward Hnetkovsky, Kenneth Hamburger, Nicholas Melly, Mark Henry Salley, Christopher U. Brown, Wai Cheong Tam, Eric Link, Michael Selepak, Philip Deardorff, Kenneth Miller, Paul Clem, Byron Demosthenous, Austin Glover, Chris LaFleur, Raymond Martinez, Anthony Tanbakuchi
This report documents an experimental program designed to investigate High Energy Arcing Fault (HEAF) phenomena for medium voltage electrical switchgear containing aluminum conductors. This report covers full-scale laboratory experiments using

Vibration-induced PM Noise of A Rigid Optical Fiber Spool

December 1, 2008
Author(s)
Jennifer A. Taylor, Craig W. Nelson, Archita Hati, Neil Ashby, David A. Howe
Oscillators operating in field applications are subject to much more strenuous environmental effects than those in the laboratory. These environmental effects, like vibration and temperature fluctuation, have a great impact on the performance of the
Displaying 1176 - 1200 of 1947
Was this page helpful?