Length and Dimensional Measurement at NIST

Published

January 1, 2001

Author(s)

Dennis A. Swyt

Abstract

This paper reports on the past, present, and future of length and dimensional measurements at NIST. It covers the evolution of the SI unit of length through its three definitions and the evolution of NBS-NIST dimensional measurement from early linescales and gage blocks to a future of atom-based dimensional standards. Current capabilities include dimensional measurements over a range of fourteen orders of magnitude. Uncertainties of measurements on different types of material artifacts range down to 7?? ?10^-8 at 1 meter and 8 picometers at 300 pm. Current work deals with a broad-range of areas of dimensional metrology. These including: large-scale coordinate systems; complex form; microform; surface finish; two-dimensional grids; optical, scanning-electron, atomic-force, and scanning-tunneling microscopies; atomic-scale displacement; and atom-based artifacts.

Citation

Journal of Research of the National Institute of Standards and Technology

Volume

106(1)

Pub Type

Journals

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Keywords

atomic force microscopy (AFM), coordinate measuring machines, dimensional, Fabry-Perot, laser, laser trackers, length, measurements, metrology, optical, optical heterodyne, scanning electron microscopy(SEM), scanning tunneling microscopy (STM), theodolites, traceability, x-ray interferometry

Citation

Swyt, D. (2001), Length and Dimensional Measurement at NIST, Journal of Research of the National Institute of Standards and Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=820983 (Accessed April 23, 2024)