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Search Publications

NIST Authors in Bold

Displaying 1501 - 1525 of 13215

2D and 3D Topography Comparisons of Toolmarks Produced from Consecutively Manufactured Chisels and Punches.

May 20, 2014
Author(s)
Xiaoyu Alan Zheng, Johannes A. Soons, Robert M. Thompson, John Villanova, Taher Kakal
… or impressed toolmark from a pool of consecutively manufactured tools. The metric will be applied to the … toolmark identification, chisel, punch, consecutively manufactured, cross correlation function, impressed tool … Comparisons of Toolmarks Produced from Consecutively Manufactured Chisels and Punches. …

A Review of Test Artifacts for Additive Manufacturing

May 24, 2012
Author(s)
Shawn P. Moylan, April L. Cooke, Kevin K. Jurrens, John A. Slotwinski, M A. Donmez
… Additive Manufacturing, Test Artifacts, Benchmarking, Rapid Prototyping … A Review of Test Artifacts for Additive Manufacturing …

Smart Transducer Web Services Based on the IEEE 1451.0 Standard

May 1, 2007
Author(s)
Yuyin Song, Kang B. Lee
… (STWS) developed at the National Institute of Standard and Technology (NIST) based on the proposed IEEE 1451.0 standard. The Smart Transducer Web Services were described in WSDL (Web Service Description Language). A prototype … to achieve interoperability with other sensor applications in WSDL. Hence it provides a foundation for Smart Transducer …

Soft MUD: Implementing Manufacturer Usage Descriptions on OpenFlow SDN Switches

March 24, 2019
Author(s)
Mudumbai Ranganathan, Douglas Montgomery, Omar Ilias El Mimouni
… Manufacturer Usage Descriptions are generalized network … to only communicate in the manner intended by the manufacturer – thus reducing their potential to launch … Soft MUD: Implementing Manufacturer Usage Descriptions on OpenFlow SDN Switches …

A Neutral Information Model for Simulating Machine Shop Operations

August 1, 2003
Author(s)
Yung-Tsun Lee, Charles R. McLean, Guodong Shao
… or data translators to import their data from other manufacturing software applications. This paper presents an … development at the National Institute of Standards and Technology (NIST) to address this problem. The model provides … Machine Shop, Manufacturing, Neutral Information Model, Simulation, …

The Development of an Aerodynamic Shoe Sampling System

November 15, 2011
Author(s)
Matthew E. Staymates, Jessica M. Grandner, John G. Gillen, Stefan Lukow
… In collaboration with the Transportation Security Laboratory, the National Institute of Standards and Technology has been developing a prototype shoe sampling … used to determine the effectiveness of particle release in the shoe sampler. Results from these experiments indicate …

REPRESENTING LAYOUT INFORMATION IN THE CMSD SPECIFICATION

July 9, 2008
Author(s)
Frank H. Riddick, Yung-Tsun T. Lee
… exchange of information between simulations and other manufacturing tools is a critical problem today. For many areas of manufacturing, neither representations for the information … the exchange of information that adheres to the model. In this paper, an effort to extend the CMSD specification to …

Unstructured Facility Navigation by Applying the NIST 4D/RCS Architecture

September 5, 2006
Author(s)
Roger V. Bostelman, Tsai Hong Hong, Tommy Chang, William P. Shackleford, Michael O. Shneier
… The National Institute of Standards and Technology s (NIST) Intelligent Systems Division (ISD) is … next generation vehicles. ISD is also a participant in the Defense Advanced Research Project Agency (DARPA) … which ISD has applied to control many intelligent systems. Technology from LAGR is being transferred to the material …

AMRF Network Communications

January 1, 1988
Author(s)
Siefried Rybczynski, Edward J. Barkmeyer Jr., Evan K. Wallace, M Strawbridge, Donald E. Libes, C Young
… describes the National Bureau of Standards (NBS) Automated Manufacturing Research Facility (AMRF) factory network … as implemented 1985 through 1987. Although changes in equipment have been made since 1986, the network … as computer integrated manufacturing continues to evolve in the AMRF. …

Material Needs and Measurement Challenges for Advanced Semiconductor Packaging: Understanding the Soft Side of Science

August 27, 2025
Author(s)
Ran Tao, Polette Centellas, Stian Romberg, Anthony Kotula, Gale Holmes, Amanda Forster, Christopher Soles, Bob Allen, Edvin Cetegen, William Chen, Jeff Gotro, Mark Poliks
… upon insights from the National Institute of Standards and Technology (NIST)-organized workshop, "Materials and … held at the 35th annual Electronics Packaging Symposium in Binghamton, NY, on September 5, 2024. It outlines critical … opportunities related to polymer-based "soft" materials in advanced semiconductor packaging, with emphasis on polymer …

An Ontology for the e-Kanban Business Process

April 1, 2007
Author(s)
Edward J. Barkmeyer Jr., Boonserm Kulvatunyou
… of principal automotive subsystems, make their products in large volumes. This means that the demands on their … to local peaks and valleys that result from variations in short-term demand and production schedules. As a … for maintaining the parts and materials inventory at the manufacturing facility. At the same time, it gives the …

IPPS: An Integrated Process Planning System

May 4, 2004
Author(s)
Suber Huang, J Mei, Xuhang Tong, Steven R. Ray
… Further, to make a generative system truly useful in production, the issue of integration must be addressed. In this paper, we introduce an Integrated Process Planning System (IPPS), which is currently being developed in the Department of Industrial Engineering, Texas Tech …

Simultaneous Measurements of Keyhole Depth and Absolute Absorptance During Stationary Laser Irradiance

June 29, 2020
Author(s)
Troy Allen, Wenkang Huange, Jack R. Tanner, Wenda Tan, James Fraser, Brian Simonds
… the underlying physics of laser welding and metal additive manufacturing (AM) is crucial to the advancement of … a dramatic e ect on the nal properties of the material. In this work, we combine integrating sphere radiometry and … showing that geometric e ects lead to an increase in absorptance from about 0:4 up to 0:9. There is also speci …

An IDEF1X Information Model for a Supply Chain Simulation

October 1, 2002
Author(s)
Yung-Tsun Lee, Shigeki Umeda
… of the simulation model that is under development for a manufacturing supply chain. An information model that serves … as a neutral interface specification is also presented in the paper. The supply chain simulation model described … interface secifications as part of the Intelligent Manufacturing Systems (IMS) Modeling and Simulation …

Tailored-Reflectivity Microstructures for Measuring Signal Sensitivity of Optical Coherence Tomography Medical Imaging Systems

May 25, 2025
Author(s)
Greta Babakhanova, Declan Fitzgerald, Joshua Guag, Zhuolin Liu, Daniel Hammer, Ryan Sochol, ANANT AGRAWAL
… and measurement of numerous ocular structures, the retina in particular. Despite its widespread use, the development of … outcomes from OCT systems has not kept pace with the technology's rapid advancements. In this work we present a novel microstructure array phantom …

Blockchain Technology Overview

October 3, 2018
Author(s)
Dylan J. Yaga, Peter M. Mell, Nik Roby, Karen Scarfone
… provides a high-level technical overview of blockchain technology. It discusses its application to cryptocurrency in … The purpose is to help readers understand how blockchain technology works, so that they can be applied to technology problems. … Blockchain Technology Overview …
Displaying 1501 - 1525 of 13215
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