Pagan, D.
, Jones, K.
, Bernier, J.
and Phan, T.
(2020),
A Finite Energy Bandwidth-Based Diffraction Simulation Framework for Thermal Processing Applications, JOM Journal of the Minerals Metals and Materials Society, [online], https://doi.org/10.1007/s11837-020-04443-7
(Accessed April 28, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
A Finite Energy Bandwidth-Based Diffraction Simulation Framework for Thermal Processing Applications
Published
Author(s)
Darren C. Pagan, Kevontrez Jones, Joel Bernier,
Abstract
We present a novel finite energy bandwidth-based diffraction simulation framework to aid the analysis of X-ray diffraction patterns gathered during in-situ advanced manufacturing processes. The framework generates two-dimensional diffraction patterns that simulate the effects of X-ray energy distributions typical of monochromating optics and uses microstructure and thermomechanical fields from advanced manufacturing simulations as input. As a demonstration of the capabilities of the framework, we model diffraction associated with selective laser melting of the nickel-based superalloy Inconel 625, employing a finite element thermal model for the input. The simulated diffraction patterns correspond to material volumes exhibiting large temperature gradients consistent with additive manufacturing processes, and we illustrate their utility for interpreting in-situ data.Citation
JOM Journal of the Minerals Metals and Materials Society
Volume
72
Issue
12
Pub Type
Journals
Download Paper
Keywords
Synchrotron X-ray diffraction, Additive Manufacturing
Citation
Created October 22, 2020, Updated December 20, 2022