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NIST Authors in Bold

Displaying 7101 - 7125 of 13218

Primary Atomic Frequency Standards at NIST

January 1, 2001
Author(s)
Donald Sullivan, James C. Bergquist, Robert E. Drullinger, Wayne M. Itano, Steven R. Jefferts, D W. Lee, D Meekhof, Thomas E. Parker, F L. Walls, David J. Wineland
… of Research of the National Institute of Standards and Technology …

Sources of Error in UV Radiation Measurements

January 1, 2001
Author(s)
Thomas C. Larason, C L. Cromer
… of Research of the National Institute of Standards and Technology … Sources of Error in UV Radiation Measurements …

The Kelvin and Temperature Measurements

January 1, 2001
Author(s)
B W. Mangum, G T. Furukawa, K G. Kreider, C W. Meyer, D C. Ripple, G F. Strouse, L Tew, M R. Moldover, B. Carol Johnson, Howard Yoon, Charles E. Gibson, Robert D. Saunders
… of Research of the National Institute of Standards and Technology …

Calibration of High-Resolution X-Ray Tomography with Atomic Force Microscopy

November 1, 2000
Author(s)
A Kalukin, B Winn, Yong Wang, C Jacobsen, Z Levine, Joseph Fu
… has achieved images with feature sizes as small as 40 nm in recent years. However, calibration of three-dimensional … with STXM data at this scale has not yet been described in the scientific literature, and the calibration procedure … by x-ray tomography carried out at a larger scale. In x-ray microtomography, for example, one always has the …

Capability in Rockwell C Scale Hardness

July 1, 2000
Author(s)
Walter S. Liggett Jr, Samuel Low, David J. Pitchure, Jun-Feng Song
… Materials (SRMs). The important innovation introduced in this paper is improved handling of the hardness variation across test-block surfaces. In addition to hardness itself, the methods in this paper might be applicable to other local measurement … of Research of the National Institute of Standards and Technology …

The NIST Quantitative Infrared Database

January 1, 1999
Author(s)
P M. Chu, F R. Guenther, G C. Rhoderick, Walter J. Lafferty
… of Research of the National Institute of Standards and Technology …

Calculation of Measurement Uncertainty Using Prior Information

November 1, 1998
Author(s)
Steven D. Phillips, William T. Estler
… include prior information about the value of the measurand in the calculation of measurement uncertainty. Typical examples show this can, in effect, reduce the expanded uncertainty by up to 85 %. The … of Research of the National Institute of Standards and Technology …

Thermodynamic Properties of Air at Pressures to 2000 MPa

August 1, 1998
Author(s)
William M. Haynes, Eric W. Lemmon, Daniel G. Friend, R Jacobsen
… The experimental and calculated properties were then used in a regression analysis to develop a fundamental equation … mole fraction composition of 0.78 N 2 + 021 0 2 + 0.01 Ar. In the range from the solidification point to 873 K at … fundamental equation for the vapor is 1%; the uncertainty in calculated liquid densities is 0.2%. The estimated …

Uncertainty Analysis for Angle Calibrations Using Circle Closure

March 1, 1998
Author(s)
William T. Estler
… types of full-circle angle calibrations: a simple closure in which a single set of unknown angular segments is … with an unknown reference angle, and a dual closure in which two divided circles are simultaneously calibrated by intercomparison. In each case, the constraint of circle closure provides …
Displaying 7101 - 7125 of 13218
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