Thermal-Conductivity Apparatus for Steady-State, Comparative Measurement of Ceramic Coatings

Published

August 1, 2000

Author(s)

Andrew J. Slifka

Abstract

An apparatus has been developed to measure the thermal conductivity of thermal barrier coatings. Since the method uses an infrared microscope for temperature measurement, coatings as thin as 20 υm can, in principle, be measured using this technique. The measurement method used is a steady-state, comparative method that uses the known thermal conductivity of the substrate material as the reference material for heat flow measurement. The experimental method is validated by measuring a plasma-sprayed coating that has been previously measured using an absolute, steady-state measurement method. The new measurement method has an experimental uncertainty of 20%. The measurement of the plasma sprayed coating gives 0.58 Wm^-1×K^-1 which compares well with the 0.62 Wm^-1×K^-1 measured using the absolute method.

Citation

Journal of Research of the National Institute of Standards and Technology

Volume

105

Issue

4

Pub Type

Journals

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Keywords

infrared microscope, thermal conductivity, thermal-barrier coating, zirconia

Citation

Slifka, A. (2000), Thermal-Conductivity Apparatus for Steady-State, Comparative Measurement of Ceramic Coatings, Journal of Research of the National Institute of Standards and Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851228 (Accessed October 14, 2025)