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Search Publications

NIST Authors in Bold

Displaying 4326 - 4350 of 13217

Impact of BTI on Random Logic Circuit Critical Timing

October 31, 2014
Author(s)
Kin P. Cheung, Jiwu Lu, Guangfan Jiao, Jason P. Campbell, Jason T. Ryan
… reliability issue for state-of-the-art Silicon MOSFET technology [1-6]. It is well-known that in addition to a “permanent” degradation, there is a large … treated as a source for lifetime extension [1-6, 8-12]. In other words, the recovery buys margin in measured …

Dimensional Metrology and Imaging of Cellulose Nanocrystals

June 14, 2013
Author(s)
Michael T. Postek, Andras Vladar
… economic value but, also present many basic research and manufacturing challenges. These challenges are not only in development of the fundamental processes needed for the … necessary for their large scale production, but also in the development of the needed measurement science for …

The Role for Engineers in Health Care Information Systems

December 30, 2008
Author(s)
Ram D. Sriram, Steven J. Fenves
… of health care information systems, support and control of manufacturing and its associated supply chains, and information and data management both in clinical practice and biological research. This paper discusses the major research issues in health care informatics and provides a brief summary of …

Industrial Uses of STM and AFM

January 1, 1997
Author(s)
Theodore V. Vorburger, John A. Dagata, G. Wilkening, K Iizuka
… research performed by industry, applications off-line in manufacturing, and applications on-line in manufacturing. We also discuss the role of metrology for …

3D Topography Measurements on Correlation Cells - A New Approach to Forensic Ballistics Identifications

April 30, 2014
Author(s)
Jun-Feng Song, Wei Chu, D Ott, Johannes A. Soons
… correlation cells, the National Institute of Standards and Technology (NIST) has developed the "NIST Ballistics … are subdivided into arrays of correlation cells in order to identify the "valid correlation areas" and … function maximum CCFmax, spatial registration position in x-y and registration angle θ) is proposed for high …

Reliability of Lead-Free Solders

December 1, 2001
Author(s)
C A. Handwerker, D Noctor, G Whitten
In the assessment of the performance of lead-free solders, … type. It is straightforward then to rank the components in terms of order of failure for eutectic lead-tin. There is … model since the failure modes of lead-free solders in use are poorly understood. The recent literature contains …

A Systems-Based Framework for Product Circularity Assessment

January 7, 2025
Author(s)
Gisele Bortolaz Guedes, Junwon Ko, Fazleena Badurdeen, I.S. Jawahir, Katherine Morris, Vincenzo Ferrero, Ardeshir Mashhadi, Ryan Bradley
… particularly when focusing on the product level, lies in its emphasis on designing products to facilitate the … all factors that characterize CPs and have limitations in the measurement methods proposed, leading to poor industry … 19th Global Conference on Sustainable Manufacturing

Industrial Wireless Cyberphysical Systems Performance Using Deep Learning

September 28, 2023
Author(s)
Mohamed Hany, Rick Candell, Karl Montgomery
… wireless communications networks have a major role in the future industrial cyber-physical systems (CPSs) to … and latency needs to be evaluated under various scenarios in order to meet the industrial CPS requirements. In order to measure the impact of deploying industrial …

Towards a Robot Task Ontology Standard

June 8, 2017
Author(s)
Stephen B. Balakirsky, Craig I. Schlenoff, Sandro R. Fiorini, Signe Redfield, Marcos Barreto, Hirenkumar Nakawala, Joel L. Carbonera, Larisa Soldatova, Julita Bermejo-Alonso, Fatima Maikore, Paulo J. Goncalves, Elena D. Momi, S. Veera Ragavan, Tamas Haidegger
… Ontologies serve robotics in many ways, particularly in describing and driving autonomous functions. These … Proceedings of the Manufacturing Science and Engineering Conference (MSEC) …

Uncertainty in Measurement of the Maximum Cutting Tool Temperature by Infrared Thermography

June 13, 2014
Author(s)
Brandon M. Lane, Eric P. Whitenton, Viswanathan Madhavan, M A. Donmez
… This paper presents an analysis of the uncertainty in measurement of the peak temperature on the side face of a … to study the uncertainty arising from uncertainties in input variables. A Monte Carlo simulation expands on the … such as point spread function of the optics, difference in emissivity of the chip and tool, and motion blur. The …

Functional Tolerancing of a Gearbox

June 1, 2003
Author(s)
H Wang, Utpal Roy, Sudarsan Rachuri, Ram D. Sriram, Kevin W. Lyons
… function information and mating condition attributes in the assembly to derive an appropriate tolerance … Other features (that are not datum features) present in the same cluster are then toleranced with respect to those … Proceedings of the North American Manufacturing Research Conference …
Displaying 4326 - 4350 of 13217
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