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Search Publications

NIST Authors in Bold

Displaying 4126 - 4150 of 13217

Leveraging standard geospatial representations for industrial augmented reality

May 1, 2020
Author(s)
Teodor I. Vernica, Aaron M. Hanke, William Z. Bernstein
… Augmented Reality (AR) has experienced a recent surge in adoption and integration within the manufacturing enterprise. While industrial AR has been … implemented and shown to have significant benefits in a variety of applications, proper use case development, …

Dimensional Review of Scales for Forensic Photography

November 25, 2015
Author(s)
Massimiliano Ferrucci, Theodore D. Doiron, Robert M. Thompson, John Jones, Adam J. Freeman, Janice A. Neiman
… for forensic photography provide a geometrical reference in the photographic documentation of a crime scene. A common … L-shaped ruler that allows for a dimensional reference in the photographic documentation of evidence or a crime … available scales exposes a lack of consistency in manufacturing processes and, consequently a lack of strict …

Report of the 95th National Conference on Weights and Measures

June 10, 2011
Author(s)
Linda D. Crown, Tina G. Butcher, Steven E. Cook, Lisa Warfield, David A. Sefcik
The 95th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 11 to 15, 2010, at the Crowne Plaza St. Paul Riverfront, St. Paul, Minnesota. The theme of the meeting was “Breaking Molds to Shape the Future.” Reports by the

Report of the 88th National Conference on Weights and Measures

December 9, 2003
Author(s)
Linda D. Crown, K M. Dresser, Steven E. Cook, Juana S. Williams, R C. Suiter, L T. Sebring, H V. Oppermann
… 13 through 17, 2003, at the John Ascuaga s Nugget Hotel in Sparks, NV. The theme of the meeting was, Moving …

Report of the 87th National Conference on Weights and Measures

December 1, 2002
Author(s)
H V. Oppermann, T L. Grimes
The 87th Annual Meeting of the National Conference on Weights & Measures (NCWM) was held July 14 through July 18, 2002, at the Omni Netherland Holtel, Cincinnati, OH. The theme of the meeting was A Progressive Partnership for the Future--You and NCWM

Security of Cell Phones and PDAs

January 29, 2009
Author(s)
Shirley M. Radack
… This bulletin summarizes the information disseminated in NIST Special Publication (SP) 800-124, Guidelines on Cell … Recommendations of the National Institute of Standards and Technology, which was written by Wayne Jansen and Karen Scarfone of NIST, and issued in October 2008. The guide provides updated information to …

Energy Efficiency Scaling for 2 Decades (EES2) R&D Roadmap. V1.0 for Compute

April 3, 2025
Author(s)
Tina Kaarsberg, M Ahmed, A Paramonov, Amanda Petford-Long, Y Zhang, C Green, D Braga, F Fatim, F Musso, J Hoff, T Shah, P Nagapurkar, S Pawlowski, W Huang, C Gotama, P Klabbers, A Ziabari, Y Chen, T Wei, B Hirano, T McDonald, A Bhavnagarwala, S Misra, James Booth, Daniel Gopman, P Sharps, J Baniecki, E Salman, J Luo, S Shaheen, D Kudithipudi, J Atulasimha, J Ballard, I Lu, K Shimizu, N Johnson, E Taylor, R Jones, S Shankar
… The looming crisis in global energy demand for computing was a key driver for … States Department of Energy's (DOE) Advanced Materials and Manufacturing Technologies Office (AMMTO) to launch in 2022 a multi-organizational effort to create a roadmap for …

Materials laboratories of the future for alloys, amorphous, and composite materials

January 29, 2025
Author(s)
Sarbajit Banerjee, Y. S. Meng, Andrew M. Minor, Minghao Zhang, Nestor J. Zaluzec, Maria K. Chan, Gerald Seidler, David W. McComb, Joshua Agar, Partha P. Mukherjee, Brent Melot, Karena Chapman, Beth S. Guiton, Robert F. Klie, Ian D. McCue, Paul M. Voyles, Ian Robertson, Ling Li, Miaofang Chi, Joel F. Destino, Arun Devaraj, Emmanuelle Marquis, Carlo U. Segre, Huinan H. Liu, Judith C. Yang, Kasra Momeni, Amit Misra, Niaz Abdolrahim, Julia E. Medvedeva, Wenjun Cai, Alp Sehirlioglu, Melike Dizbay-Onat, Apurva Mehta, Lori Graham-Brady, Benji Maryuama, Krishna Rajan, Jamie H. Warner, Mitra L. Taheri, Sergei V. Kalinin, B. Reeja-Jayan, Udo D. Schwarz, Sindee L. Simon, Craig Brown
… In alignment with the Materials Genome Initiative and as the … define a vision for materials laboratories of the future in alloys, amorphous materials, and composite materials; … needs, accelerates technological innovation, and enhances manufacturing competitiveness. Spanning three important …

Research Report: User Perceptions of Smart Home Privacy and Security

November 17, 2020
Author(s)
Julie M. Haney, Susanne M. Furman, Yasemin Acar
… transparency and configuration options. This results in little meaningful mitigation action to protect users' … of smart home privacy and security, we conducted an in- depth interview study of 40 smart home users. The results … many participants displayed a willingness to accept risks in favor of smart home benefits, and they feel limited …

Control Fusion for Safe Multi-robot Coordination

May 9, 2014
Author(s)
Roger V. Bostelman, Jeremy A. Marvel
… Future smart manufacturing systems will include more complex coordination … on mobile bases). The National Institute of Standards and Technology, Performance of Collaborative Robot Systems …

Guidelines for Smart Grid Cyber Security

August 31, 2010
Author(s)
Annabelle Lee
… components to the electric grid that communicate in much more advanced ways (e.g., two-way communications, and wired and wireless communications) than in the past. This report is for individuals and organizations … and the supporting analyses that are included in this report may be used by strategists, designers, …

Static and Dynamic Stability Performance Measurements of the Home Lift, Position and Rehabilitation (HLPR) Chair/Forklift

March 3, 2010
Author(s)
Joshua Johnson, Roger V. Bostelman
… developed at the National Institute of Standards and Technology (NIST), has unique capabilities and a unique shape … Chair was converted into an autonomous forklift for the manufacturing industry. The HLPR forklift includes … were created and tested that are currently not provided in these standards because of HLPR's unique lift and rotation …

A Factory-Wide EDA Data Quality Performance Simulation for APC Capabilities Analysis

October 1, 2008
Author(s)
Xiao Zhu, Dhananjay Anand, Sulaiman Hussain, Ya-Shian Li-Baboud, James Moyne
… Realizing benefits from real-time process control requires in-situ monitoring of process environment, equipment, and the … parameters necessary for ensuring high precision manufacturing for optimal yield. To ensure accurate data … and performance, the National Institute of Standards and Technology and the University of Michigan have developed a …

NIST Goniospectrometer for Surface Color Measurements

July 7, 2008
Author(s)
Maria E. Nadal, Gael Obein
… at the National Institute of Standards and Technology (NIST) can measure the spectral reflectance of … aspects that are currently judged by human observers in the manufacturing process. An example is distinctiveness of image … CIE Symposium on Advances in Photometry and Colorimetry …

Observations of Pt/Ne hollow cathode lamps similar to those used on the Cosmic Origins Spectrograph

July 7, 2008
Author(s)
Gillian Nave, Craig J. Sansonetti, S. V. Penton, Nathaniel Cunningham, Matthew Beasley, Steve Osterman, F Kerber, Charles D. Keyes, Michael R. Rosa
… accelerated aging tests on three Pt/Ne lamps from the same manufacturing run as lamps installed on the Cosmic Origins Spectrograph (COS). One lamp was aged in air at the National Institute of Standards and Technology (NIST) at a current of 10 mA and 50 % duty cycle …

A Neutral Data Interface Specification for Simulating Machine Shop Operations

September 1, 2004
Author(s)
Yung-Tsun Lee, Charles R. McLean
… In most cases, the effort required to develop a meaningful … simulators are not designed to use traditional shop data in its native format, so models and data import routines … underway at the National Institute of Standards and Technology (NIST) to develop neutral, standard, data …

Nanometrology - FY 2003 Program and Selected Accomplishments

December 15, 2003
Author(s)
Clare M. Allocca, Stephen W. Freiman
… devices and material ensembles. Materials at the nanoscale in three dimensions (NEMS, MEMS), two dimensions (ultrathin … key roles in a spectrum of industry sectors, including manufacturing, information technology, electronics, and healthcare. Nanometrology, i.e., …

Characterisation of Thermally Sprayed Metallic NiCrAlY Deposits by Multiple Small-Angle Scattering

December 1, 2002
Author(s)
T Keller, W. Wagner, Andrew J. Allen, J Ilavsky, S Siegmann, N Margadant, G Kostorz
… and flame-spraying). MSANS measurements were made in directions parallel and perpendicular to the surface … cross sections, the complex microstructures were modelled in terms of three distinct void systems. Employing the most … from small-angle neutron scattering (SANS) analysis in the Porod regime. Relationships to macroscopic coating …

Bidirectional Reflectance Distribution Function of Rough Silicon Wafers

July 1, 2001
Author(s)
Y J. Shen, Z M. Zhang, Benjamin K. Tsai, D P. DeWitt
… The trend towards miniaturization of patterning features in integrated circuits (IC) has made traditional batch … wafers has become more popular in recent years for IC manufacturing. Light-pipe radiation thermometry is the method … (STARR) at the National Institute of Standards and TEchnology (NIST). The rms roughness of these samples ranges …

Membrane Filtration of Natural Organic Matter: Factors and Mechanisms Affecting Rejection and Flux Decline With Charged Ultrafiltration (UF Membrane)

May 1, 1999
Author(s)
J Cho, G Amy, J J. Pellegrino
… ultrafiltration membrane based on thin-film-composite technology. NOM rejection mechanisms such as steric exclusion … effective relative molecular mass cutoff for the NOM in our study was between 1500 and 2300 (significantly lower … value of 8000) and depended on the NOM characteristics in the source water. In particular the ratio of UV absorbance …
Displaying 4126 - 4150 of 13217
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