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Displaying 14851 - 14875 of 17286

Refrigerant/Lubricant Mixture Boiling Heat Transfer Research at NIST

September 1, 2000

Author(s)

Mark A. Kedzierski

… of the recent few years at NIST (National Institute of Standards and Technology) on refrigerant/lubricant mixtures. …

NIST List of Publications LP 103, National Semiconductor Metrology Program/Semiconductor Electronics Division, 1990-1999

April 12, 2000

Author(s)

A D. Settle-Raskin

… The National Institute of Standards and Technology (NIST) began its first semiconductor …

Characterization of the Inlet Combustion Air in NIST's Reference Spray Combustion Facility: Effect of Vane Angle and Reynolds Number.

January 1, 2000

Author(s)

J F. Widmann, S R. Charagundla, Cary Presser

The airflow through a 12-vane cascade swirl generator is examined numerically to characterize the inlet combustion air in the reference spray combustion facility at NIST. A three-dimensional model is used to simulate the aerodynamics in the swirl generator

Characterization of the Inlet Combustion Air in NIST's Reference Spray Combustion Faciltiy: Effect of Vane Angle and Reynolds Number

January 1, 2000

Author(s)

J F. Widmann, R Charagundla, Cary Presser

Predicting the Performance of Concrete Repair Materials: Summary of Workshop, April 26 and 27, 1999, Durham New Hampshire

January 1, 2000

Author(s)

A M. Vaysburd, Nicholas J. Carino, B Bissonette

… workshop held in 1995 at the National Institute of Standards and Technology which dealt with research needs to …

The Electron Microscope: The Materials Characterization Tool of the Millenium

January 1, 2000

Author(s)

Dale E. Newbury, D B. Williams

Transmission and scanning electron microscopes (TEM and SEM) together offer the most complete tool available for the characterization of materials. This combination of TEM and SEM provides surface and internal imaging of all solid materials over a

Fracture Toughness (K IC ) of a Dental Porcelain Determined by Fractographic Analysis

September 1, 1999

Author(s)

Susanne Scherrer, J R. Kelly, George D. Quinn, K Xu

Fractographic analysis of indentation cracks is performed following flexure testing as part of the ASTM (1997) standard for fracture toughness, K Ic, determination in advanced ceramics. The purpose of this study was to evaluate the use of fractography in

Conceptual Process Planning - A Definition and Functional Decomposition

August 1, 1999

Author(s)

Shaw C. Feng, Gordon A. Shaw, Yuyun Zhang

… in the design process. At the National Institute of Standards and Technology, the Design and Process Planning …

A Fine-Grained, Detailed, Synchronized Measurement Toolkit for Web Client-Server Performance

June 28, 1999

Author(s)

D C. Tang, Francis W. Wang, X He

… were developed by the U.S. National Institute of Standards and Technology (NIST) and ALMT is available as a …

Two-Dimensional Calibration Artifact and Measurement Methodology

June 1, 1999

Author(s)

Richard M. Silver, Theodore D. Doiron, William B. Penzes, S Fox, Edward A. Kornegay, S Rathjen, M Takac, D Owen

In this paper, we describe our design and the manufacturing of a two-dimensional grid artifact of chrome on quartz on a 6 inch by 6 inch by .250 glass blank. The design has been agreed upon by a number of SEMI participants working on a two-dimensional

Modeling Chamber Radiation Effects on Pyrometric Temperature Measurement in Rapid Thermal Processing

May 2, 1999

Author(s)

F Rosa, Yong Zhou, Z M. Zhang, D P. DeWitt, Benjamin K. Tsai

A detailed analysis of the radiation environment in the lower chamber of the RTP test bed at the National Institute of Standard and Technology (NIST) is performed to improve the accuracy of radiation thermometry. The models developed in this work consider

The NIST Design Repository Project

March 1, 1999

Author(s)

Simon Szykman, Ram D. Sriram, Christophe Bochenek, J Racz

… knowledge. This paper describes the National Institute of Standards and Technology (NIST) Design Repository Project, an …

Trilateral Intercomparison of Photometric Units Maintained at NIST (USA), NPL (UK), and PTB (Germany)

January 1, 1999

Author(s)

Yoshihiro Ohno, T Goodman, G Sauter

A trilateral intercomparison of photometric units between NIST (USA), NPL (UK), and PTB (Germany) has been conducted to update the knowledge of the relationship between the photometric units disseminated in the three countries. The luminous intensity unit

Development of a Bolometer Detector System for the NIST High Accuracy Infrared Spectrophotometer

November 1, 1998

Author(s)

Yuqin Zong, Raju V. Datla

… infrared spectropho-meter at the National Institute of Standards and Technology (NIST) to provide maximum sensitive, …

NIST Workshop on Process Information Technology: From Research to Industry

October 1, 1998

Author(s)

Howard T. Moncarz, Craig I. Schlenoff, Michael Gruninger, M R. Duffey, Amy Knutilla

… and of current research efforts; To determine the need for standards for process information and the role of NIST in …

A System to Measure Current Transducer Performance

July 1, 1998

Author(s)

Bryan C. Waltrip, Thomas L. Nelson

A special purpose ac current transducer measurement system capable of intercomparing transducers with ac output voltage ratios from 1:1 to 50:1 has been developed to extend the range and accuracy of current transformer, current shunt, and mutual inductor

Assessment of Color Measurement Systems Using Interference Filters

July 1, 1998

Author(s)

Paul A. Boynton, Eric Kelley

Spectroradiometers and tristimulus colorimeters are used in display measurements to measure color in one of several color space coordinate systems. How well these instruments can measure the color coordinates can be simply checked by using interference

A Hybrid Manufacturing System Modeling Environment Using VRML

January 1, 1998

Author(s)

R K. Krishnamurthy, Charles R. McLean, J Shewchuk

… and State University (VPI) and the National Institute of Standards and Technology (NIST) is using VRML as a Hybrid …

Process Effects on White Layer Formation in Hard Turning

January 1, 1998

Author(s)

Y K. Chou, Christopher J. Evans

This paper discusses surface microstructural alterations in hard turned steels. A metallurgically unetchable structure, called white layer?, followed by a dark etching layer has been found on AISI 52100 steel surfaces machined in a hardened state (60 Rc)

SFRF: Spatial Frequency Response Function Estimation Program

November 10, 1997

Author(s)

Thomas A. Germer, Clara C. Asmail

Measurements of optical scatter are often employed in production line diagnostics for surface roughness of silicon wafers. However, the geometry of the optical scatter instrumentation lacks universal standardization, making it difficult to compare values

Discussion of Statistical Issues in Geometric Feature Inspection Using Coordinate Measuring Machines

February 1, 1997

Author(s)

Steven D. Phillips, K Eberhardt

… Problems arise in their use, however, because tolerancing standards require knowledge of the entire surface while a CMM …

Models for Integrating Scheduling and Shop Floor Data Collection

February 1, 1997

Author(s)

Frank H. Riddick, V. Lourenco

… a project is underway at the National Institute of Standards and Technology (NIST) to facilitate the development …

Development of Manufacturing Systems Models Using VRML

January 1, 1997

Author(s)

V Krishnamurthy, Michael Iuliano, Charles R. McLean

… effort being undertaken at the National Institute of Standards and Technology (NIST) to support the application of …

Simulating the Effects of HVAC Induced Air Flow From Slot Diffusers on Detector Response (NISTIR 5908)

December 1, 1996

Author(s)

J H. Klote, Glenn P. Forney, William D. Davis, Richard W. Bukowski

… when a particular system is designed. At present, the standards used to guide the design of systems contain very …

Device Driver Development for Microsoft Windows NT1: Accessing Motion Control Hardware Using a Multimedia Framework

October 1, 1996

Author(s)

Richard D. Schneeman

In order to integrate motion control hardware into an advanced operating system such as Microsoft Windows NT, a flexible set of device drivers delivering a wide range of motion control services are required. This paper describes the set of user and kernel

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