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Displaying 14776 - 14800 of 17286

NIST Realization of the ITS-90 Gallium Fixed Point

August 1, 2005
Author(s)
Gregory F. Strouse
As defined by the International Temperature Scale of 1990 (ITS-90), the gallium melting-point cell (29.7646 C) is used in the calibration of standard platinum resistance thermometers (SPRTs) for the ITS-90 subranges from 39 C to 30 C and from 0 C to 30 C

Testing Web Applications by Modeling with FSMs

August 1, 2005
Author(s)
A Andrews, A. J. Offutt, R Alexander
… Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from …

Dynamic Model: Concerts and Usage Rules

July 1, 2005
Author(s)
Leonard J. Gallagher
… Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from …

MuJava: An Automated Class Mutation System

June 1, 2005
Author(s)
Y Ma, A. J. Offutt, Y R. Kwon
… Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from …

Proximity Beacons and Mobile Device Authentication: an Overview and Implementation

June 1, 2005
Author(s)
Wayne Jansen, Serban I. Gavrila, Vladimir Korolev
The use of mobile handheld devices within the workplace is expanding rapidly. These devices are no longer viewed as coveted gadgets for early technology adopters, but have instead become indispensable tools that offer competitive business advantages for

Voluntary Voting System Guidelines

May 1, 2005
Author(s)
Mark Skall
… Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from …

Nanometrology - FY 2004 Programs and Selected Accomplishments

April 15, 2005
Author(s)
C M. Allocca
The MSEL Nanometrology Program incorporates basic measurement metrologies to determine material properties, process monitoring at the nanoscale, nano-manufacturing and fabrication techniques, and structural characterization and analysis techniques, such as

NIST/XDS Test Kit, Version 1.5

December 1, 2004
Author(s)
William J. Majurski, A Mccaffrey, Mary T. Laamanen
… Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from …

NIST/XDS Test Kit, Version 1.3 & 1.4

November 1, 2004
Author(s)
William J. Majurski, A Mccaffrey, Mary T. Laamanen
… Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from …

The Importance of Distributed Loading and Cantilever Angle in Piezo-Force Microscopy

November 1, 2004
Author(s)
B D. Huey, C Ramanujan, M Bobji, J Blendell, Grady S. White, R Szoszkiewicz, A Kulik
Piezo-force microscopy (PFM) is a variation of atomic force microscopy that is widely applied to investigate piezoelectric thin films at the nanometer scale. Curiously, PFM experiments are found to be remarkably sensitive to the position along the

Toward a Formal Common Information Model Ontology

November 1, 2004
Author(s)
Stephen Quirolgico, P Assis, A Westerinen, M Baskey, E Stokes
Self-managing systems will be highly dependent upon information acquired from disparate applications, devices, components and subsystems. To be effectively managed, such information will need to conform to a common model. One standard that provides a
Displaying 14776 - 14800 of 17286
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