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NIST Authors in Bold

Displaying 13951 - 13975 of 17285

Injection Locking of a Semiconductor Double Quantum Dot Micromaser

November 2, 2015
Author(s)
Michael Gullans, Y.-Y. Liu, J. Stehlik, Jacob M. Taylor, Jason Petta
The semiconductor double quantum dot (DQD) micromaser generates photons through single electron tunneling events. Charge noise couples to the DQD energy levels, resulting in a maser linewidth that is 100 times larger than the Schawlow-Townes prediction. We

An Additive Manufacturing Test Artifact

October 23, 2014
Author(s)
Shawn P. Moylan, John A. Slotwinski, A L. Cooke, Kevin K. Jurrens, M A. Donmez
We propose a test artifact, intended for standardization, for the purpose of evaluating the performance of additive manufacturing (AM) systems. A thorough analysis of previously proposed AM test artifacts as well as experience with machining test artifacts

Metrology for 3D Integration

May 13, 2014
Author(s)
Richard Allen, Victor H. Vartanian, David T. Read, Winthrop A. Baylies
… metrology solutions, and provide examples from SEMI standards describing methods for characterizing the quality …

High-Accuracy Measurements of the Vapor Pressure of Ice Referenced to the Triple Point

December 6, 2013
Author(s)
Katarzyna E. Bielska, Daniel K. Havey, Gregory E. Scace, D Lisak, Allan H. Harvey, Joseph T. Hodges
The vapor pressure of hexagonal (Ih) ice was measured over the temperature range 175 K to 253.4 K and referenced to the value at the triple point of water. This experiment combined a highly accurate humidity generation system containing an ice-coated

Synthesis of Manufacturing and Facility Data for Sustainability Analysis

June 8, 2012
Author(s)
John L. Michaloski, Guodong Shao, Swee K. Leong, Frank H. Riddick, Jonatan Berglund, Jorge Arinez, Stephan Biller
This paper discusses data synthesis of production and facility knowledge for sustainability analysis by applying the ISA 95 "Activity Models of Manufacturing Operations Management" (MOM) model. Presently, production and facility management are "silo"

Polarized He-3 cell development and application at NIST

June 14, 2011
Author(s)
Thomas R. Gentile, WangChun Chen, Changbo Fu, Shannon Watson, Gordon L. Jones, J. W. McIver, D. R. Rich
… developed and tested at the U.S. National Institute of Standards and Technology (NIST). These cells have primarily …
Displaying 13951 - 13975 of 17285
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