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Displaying 11876 - 11900 of 17279

UML 2 Activity and Action Models

July 1, 2003
Author(s)
Conrad E. Bock
This is the first in a series introducing the activity model in the Unified Modeling Language, version 2 (UML 2), and how it integrates with the action model [1]. The series is a companion to the standard, providing additional background, rationale

Obtaining Spectral Data for Colorimetry

June 1, 2003
Author(s)
Yoshihiro Ohno
Simulation analyses have been conducted on the colorimetric errors associated with the data interval, bandpass, and wavelength errors of a spectrometer, using spectral data of 43 object color samples including those from CIE 13.3, BCRA tiles, and the

A Laser Tracker Calibration System

January 1, 2002
Author(s)
Daniel S. Sawyer, Bruce R. Borchardt, Steven D. Phillips, Charles Fronczek, William T. Estler
We describe a laser tracker calibration system developed for frameless coordinate metrology systems. The system employs a laser rail to provide an 'in situ' calibrated length standard that is used to test a tracker in several different configurations. The

Fire Safe Materials Project at NIST (NISTIR 6588)

November 1, 2000
Author(s)
Takashi Kashiwagi, Kathryn M. Butler, Jeffrey W. Gilman
… Fire Safe Materials Project at the National Institute of Standards and Technology (NIST), are presented. One of them …

SIMnet - a Collaborative Tool for Metrology in the Americas

May 1, 1999
Author(s)
Piotr S. Filipski, Nile M. Oldham
The use of video conferencing equipment used with the Internet to facilitate international comparisons and collaborations is described. The system employs standard hardware and software at a number of National Metrology Institutes within the Americas and a

VAMAS Technical Working Area #3

March 1, 1999
Author(s)
George D. Quinn, E F. Begley
… Area #3, Ceramics of the Versailles Advanced Materials and Standards (VAMAS) project has conducted 12 projects and …

A Calibrated Atomic Force Microscope

January 1, 1994
Author(s)
T Mcwaid, J Schneir
… are no sub-micrometer pitch or sub-ten nanometer height standards suitable for calibrating AFMs. University- and …

A Prototype Application Protocol for Ready-to-Wear Pattern Making

January 1, 1993
Author(s)
Yung-Tsun Lee, Howard T. Moncarz
A Ready-to-Wear Pattern Making Information Model is introduced for extending the emerging international Standard for the Exchange of Product Model Data (STEP) to include the exchange of apparel pattern data. This model focuses on a representation of two

Security Auditing of Internet of Things Devices in a Smart Home

October 15, 2021
Author(s)
Suryadipta Mazumdar, Daniel Bostos, Anoop Singhal
… the high-level security recommendations provided by standards and best practices are not readily applicable to … actionable security rules from existing security standards and best practices and conducting security audits …
Displaying 11876 - 11900 of 17279
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