A Prototype Application Protocol for Ready-to-Wear Pattern Making
Yung-Tsun Lee, Howard T. Moncarz
A Ready-to-Wear Pattern Making Information Model is introduced for extending the emerging international Standard for the Exchange of Product Model Data (STEP) to include the exchange of apparel pattern data. This model focuses on a representation of two-dimensional (flat) patterns generated by the traditional ready-to-wear pattern making and grading method. A testing methodology of the information model is also described in this paper.
pattern making information model, STEP, apparel, testing methodology
and Moncarz, H.
A Prototype Application Protocol for Ready-to-Wear Pattern Making, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.5115, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=821275
(Accessed December 8, 2023)