U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 5451 - 5475 of 17264

Overview of TREC 2005

May 17, 2006
Author(s)
Ellen M. Voorhees
… TREC 2005, was held at the National Institute of Standards and Technology (NIST) November 15--18, 2005. The … Special Publication (NIST SP) - 500-266 …

Characterization of Reference Materials 8690 to 8693

February 13, 2023
Author(s)
Jessica Reiner, Benjamin Place, N. Alan Heckert, Katherine Peter, Alix Rodowa
… The National Institute of Standards and Technology (NIST) Reference Materials (RMs) … in methanol and modified by addition of PFAS analytical standards. This publication documents the production, … Special Publication (NIST SP) - 260-234 …

Final Report of WPEC Subgroup 7

January 1, 2006
Author(s)
S Tagesen, H Vonach, F J. Hambsch, Z Chen, H M. Hofmann, K Shibata, S Y. Oh, S A. Badikov, E V. Gai, V G. Pronyaev, D L. Smith, G M. Hale, T Kawano, Allan D. Carlson, N M. Larson
… Nuclear Data Standards NEA ISBN 92-64- …

Summary of ISO/TC 201 Standard: XIII. ISO 18114:2003 - Surface Chemical Analysis - Secondary Ion Mass Spectrometry - Determination of Relative Sensitivity Factors From Ion-Implanted Reference Materials

March 1, 2006
Author(s)
David S. Simons
… for the calibration of instruments. This international Standard was prepared to provide a uniform method for … of the same matrix material can be determined. In this standard, terms are defined and a formula is given for … from a SIMS depth profile of an ion-implanted external standard. Options are provided for cycle-by-cycle …

Recent Developments in Thermoelectric Metrology at NIST

July 10, 2010
Author(s)
Winnie K. Wong-Ng, Joshua B. Martin, Nathan Lowhorn, Makoto Otani, Evan L. Thomas, Martin L. Green, Jason Hattrick-Simpers, Yonggao Y. Yan, Thanh Tran, Jihui Yang
We have successfully developed several important thermoelectric metrologies in recent years at NIST. First, a low temperature (10 K to 390 K) Seebeck coefficient Standard Reference Material (SRM™), Bi2Te3, which is crucial for inter-laboratory data

Evaluation of Component-Based Reconfigurable Machine Controllers

June 13, 2002
Author(s)
S Kolla, John L. Michaloski, William G. Rippey
… The lack of interoperability and integration standards is severely hindering manufacturing productivity. … (GMC) Testbed has been developed at National Institute of Standards and Technology (NIST) with one of its goals to …
Displaying 5451 - 5475 of 17264
Was this page helpful?