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Search Publications

NIST Authors in Bold

Displaying 3126 - 3150 of 17262

Interfacial Reaction of Co-Fe Films with SiO_{2} Substrates

March 27, 2013
Author(s)
Leonid A. Bendersky, N. V. Kazantseva, Ursula R. Kattner, M K. Kang, Vladimir P. Oleshko, Dwight Hunter, Ichiro Takeuchi
… (a) recrystallization of as-deposited films during the 800 ˚C annealing results in large grains of the bcc Co-Fe …

Object-Oriented Application Framework for IEEE 1451.1 Standard

August 1, 2005
Author(s)
Eugene Song, Kang B. Lee
… and support of the IEEE 1451 Smart Transducer Interface Standard for Sensors and Actuators. One of the main … object-oriented application framework for the IEEE 1451.1 standard. This framework consists of four layers ? the … layer focuses on the class hierarchy of the IEEE 1451.1 standard. It consists of the Neutral Model and …

Report from the NIST Workshop: Launch of the Rapid Microbial Testing Methods Consortium

September 27, 2022
Author(s)
Nancy Lin, Scott Jackson, Stephanie Servetas, Kirsten Parratt, Joy Dunkers, Tara Eskandari, Sheng Lin-Gibson
… Consortium aims to address the need for measurements and standards to increase confidence in the use of rapid testing … Special Publication (NIST SP) - 1272 … contamination, microbial detection, rapid methods, standards, workshop report …

Quantum-Based Photonic Sensors for Pressure, Vacuum, and Temperature Measurements: A Vison of the Future with NIST on a Chip

September 17, 2021
Author(s)
Jay H. Hendricks, Zeeshan Ahmed, Daniel Barker, Kevin O. Douglass, Stephen Eckel, James A. Fedchak, Nikolai Klimov, Jacob Edmond Ricker, Julia Scherschligt
… by the crea-tion of deployed and often miniaturized standards. These standards, when based on fundamental properties of nature, … known as the SI. NIST is also developing quantum-based standards for SI traceability known as QSI, or Quantum based … Quantum-Based Standards, Photonic, NOAC, NIST on a Chip, SI …

Material Standards for Environmental Health and Safety for Engineered Nanoscale Materials

September 13, 2007
Author(s)
Dianne L. Poster, John A. Small, Michael T. Postek
… Materials (available at www.nano.gov), identifies standards and standard measurement protocols as a critical, … response to this research need, the National Institute of Standards and Technology (NIST) sponsored a workshop on Material Standards for Environmental Health and Safety for Engineered …

An Application Framework for IEEE 1588 Standard

September 29, 2008
Author(s)
Yuyin Song, Kang B. Lee
… of Electrical and Electronics Engineers (IEEE) 1588 standard. This application framework developed at the … An Application Framework for IEEE 1588 Standard …

Development of Traceable Small Force Standards

June 1, 2005
Author(s)
Gordon A. Shaw, Jon R. Pratt
… aimed at measuring and disseminating SI-treaceable force standards in the piconewton to micronewton regime. Efforts in … methods for disseminating these NIST-traceable small force standards. … Development of Traceable Small Force Standards …

Smart Card Technology: New Methods for Computer Access Control

September 1, 1988
Author(s)
Martha E. Haykin, Robert B. Warnar
… systems and research conducted at the National Bureau of Standards (NBS) in the area of smart card access control … smart cards and related devices. An overview of current standards activities for smart cards is given in an appendix. … Special Publication (NIST SP) - 500-157 …

Cryogenic Primary Standard for Optical Fibre Power Measurement

August 17, 2018
Author(s)
Malcolm G. White, Zeus Ruiz, Christopher S. Yung, Igor Vayshenker, Nathan A. Tomlin, Michelle S. Stephens, John H. Lehman
… commissioning a new, state-of-the-art cryogenic primary standard for optical fibre power measurement and calibration. … route between the device under test and primary standard. Two silicon micro- machined planar detectors, with … Capability. We verified the performance of the new standard by comparing it to our current standard using four …

An Upper Bound to the Frequency Dependence of the Cryogenic Vacuum-Gap Capacitor

September 6, 2006
Author(s)
Neil M. Zimmerman, Brian Simonds, Yicheng Wang
In attempting to develop a capacitance standard based on the charge of the electron, one question which has been open for many years is the frequency dependence of the vacuum-gap cryogenic capacitor. In this paper, we succeed in putting an upper bound on

Introduction to ISO 10303 - the STEP Standard for Product Data Exchange

March 1, 2001
Author(s)
Mike Pratt
… been working on the development of a comprehensive standard for the electronic exchange of product data between … has been on design and manufacturing applications. This standard, ISO 10303, is informally known as STEP (Standard for the Exchange of Product model data). Its scope …

Introduction to ISO 10303 - The STEP Standard for Product Data Exchange

November 1, 2000
Author(s)
Mike Pratt
… has been working on the development of a comprehensive standard for the electronic exchange of product data between … has been on design and manufacturing applications. This standard, ISO 10303 [1,2,3], is informally known as STEP (STandard for the Exchange of Product model data). Its scope …

Luminous Intensity of LEDs at NIST

October 1, 2001
Author(s)
Carl C. Miller, Yoshihiro Ohno
… method have been developed at the National Institute of Standards and Technology (NIST). The scale has been …
Displaying 3126 - 3150 of 17262
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