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Development of Traceable Small Force Standards

Published

Author(s)

Gordon A. Shaw, Jon R. Pratt

Abstract

Although instrumented indentation and atomic forcve microscope (AFM) are utilized extensively for the measurement of forces in the piconewton to millinewton regime, accurate calibration of these forces remains an obstacle to quantitative research. Deadweight mass calibration artifacts available from NIST allow for SI-traceable measurement of forces as small as five micronewtons with an uncertainty of parts in 104, but there is currently no method for calibration of forces smaller than this. Work a the Small Force Measurement Laboratory (SFML) at NIST is aimed at measuring and disseminating SI-treaceable force standards in the piconewton to micronewton regime. Efforts in the calibration of instrumented indenters and AFM cantilevers will be discussed, as will methods for disseminating these NIST-traceable small force standards.
Volume
6
Conference Dates
June 7-9, 2005
Conference Location
Portland, OR
Conference Title
Society for Experimental Mechanics Annual Meeting

Keywords

AFM, indentation, materials science, mechanical testing, nanotechnology

Citation

Shaw, G. and Pratt, J. (2005), Development of Traceable Small Force Standards, Society for Experimental Mechanics Annual Meeting, Portland, OR (Accessed May 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 1, 2005, Updated February 19, 2017