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NIST Authors in Bold

Displaying 3101 - 3125 of 17262

Standards for cell line authentication and beyond

June 14, 2016
Author(s)
Jamie L. Almeida, Kenneth D. Cole, Anne L. Plant
… Here we discuss the power of this document, and why standards such as this are so critical for establishing the … Standards for cell line authentication and beyond …

Workshop on Standards for Biomedical Materials and Devices

September 1, 2001
Author(s)
John A. Tesk, D Hall
… other recent NIST efforts to make its leadership in standards and measurements more available to the health care … goal of the workshop was to identify and prioritize standards needs in selected biomedical materials and devices technologies as the basis for a NIST standards strategy in those areas. The technical focus areas …

Contextualized Filtering for Shared Cyber Threat Information

July 18, 2021
Author(s)
Athanasios Dimitriadis, Christos Prassas, Jose L. Flores, Boonserm Kulvatunyou, Nenad Ivezic, Dimitris Gritzalis, Ioannis Mavridis
… can support compliance with the Special Publication 800-150 of the National Institute of Standards and Technology. …

Multiple-Instrument Evaluation of the Consistency and Long Term Stability of Tip Width Calibration for Critical Dimension Atomic Force Microscopy

June 19, 2017
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji
… Since 2004 standards for calibration of CD-AFM tip width have been … institutes (NMIs) – such as the National Institute of Standards and Technology (NIST) in the United States. There … but less attention has been paid to long term stability of standards and monitoring for damage, wear, or contamination. …

Direct Josephson Array Voltage Comparison Between NRC and NIST

July 1, 2006
Author(s)
Barry Wood, Yi-hua D. Tang, Clark A. Hamilton
… Josephson array standard of the National Institute of Standards and Technology (NIST) at 10 V. A simplified biasing … 7th interlaboratory comparison (ILC) of Josephson Voltage Standards (JVS) at 10 V sponsored by the National Conference of Standards Laboratories International (NCSLI). …

Standard Reference Material 2100: Fracture Toughness of Ceramics

June 1, 2001
Author(s)
George D. Quinn, K Xu, R J. Gettings, J A. Salem, J Swab
… New Standard Reference Material (SRM) 2100 is the first reference … use beams in bending. The SRM complements the new ASTM Standard Test Method for Determination of Fracture Toughness … Standard Reference Material 2100: Fracture Toughness of …

Scaling of Testing Speed for Different Source-to-Detector Distances

February 13, 2015
Author(s)
Bruce R. Norman, Anne L. Sallaska, Leticia Pibida
… and International Electrotechnical Commission (IEC) standards were developed for radiation detection systems used … of illicit trafficking of radioactive materials. These standards cover a wide range of tests, some of which require … speed scaling, testing of RIDs, moving source, ANSI N42 standards for homeland security, IEC standards

Electrical breakdown in the microscale: testing the standard theory

December 29, 2006
Author(s)
Emmanouel S. Hourdakis, Garnett W. Bryant, Neil M. Zimmerman
… Analyzing the data in that regime, using the theory of standard field emission and field amplification on the … protrusions using an AFM. We find several reasons why the standard theory does not appear to explain our data. We also … observed current is not warranted. We conclude that the standard theory is not sufficient. …

Resistance Measurement Assurance Program at NIST

July 1, 1998
Author(s)
Ronald F. Dziuba, June E. Sims
… The National Institute of Standards and Technology (NIST) offers resistance Measurement … 1998 National Conference of Standards Laboratories Workshop and Symposium (NCSL) …

Interfacial Reaction of Co-Fe Films with SiO_{2} Substrates

March 27, 2013
Author(s)
Leonid A. Bendersky, N. V. Kazantseva, Ursula R. Kattner, M K. Kang, Vladimir P. Oleshko, Dwight Hunter, Ichiro Takeuchi
… (a) recrystallization of as-deposited films during the 800 ˚C annealing results in large grains of the bcc Co-Fe …

Dimensional Metrology at the Nanometer Level: Combined SEM and PPM

July 1, 1997
Author(s)
Michael T. Postek, H Ho, L Harrison
… The National Institute of Standards and Technology (NIST) is currently exploring the … will be used in the development of NIST traceable standards for dimensional metrology at the nanometer level. … electron microscope, Standard Reference Materials, standards

Graphene Epitaxial Growth on SiC(0001) for Resistance Standards

June 1, 2012
Author(s)
Mariano A. Real, Tian T. Shen, George R. Jones Jr., Randolph Elmquist, Johannes A. Soons, Albert Davydov
… Electrical resistance standards, epitaxial growth, graphene, surface morphology, … Graphene Epitaxial Growth on SiC(0001) for Resistance Standards

Towards Standard Exoskeleton Test Methods for Load Handling

May 9, 2019
Author(s)
Roger V. Bostelman, Ya-Shian Li-Baboud, Ann Virts, Soocheol Yoon, Mili Shah
… by several manufacturers and yet there are currently no standard test methods to compare exoskeletons to task. The … Towards Standard Exoskeleton Test Methods for Load Handling …

Instrument Interface Standards for Interoperable Ocean Sensor Networks

May 11, 2009
Author(s)
Kang B. Lee, Yuyin Song, Thomas O'Reilly, K. Headley, D. Edgington, C. Rueda, J. Zedlitz , J. Del Rio, E. Delory, S. Fairgrieve, L. Bermudez
… being developed to address these challenges. Some of these standards apply at the IP-network level and enable … instrument device itself. These native instrument protocol standards offer the possibility of more uniform and simpler … Instrument Interface Standards for Interoperable Ocean Sensor Networks …
Displaying 3101 - 3125 of 17262
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