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NIST Authors in Bold

Displaying 2201 - 2225 of 4212

MSIDs Continuous Improvement Activities

January 1, 2001
Author(s)
Sharon J. Kemmerer, Kristy D. Thompson
… the National Institute of Standards and Technology (NIST), Manufacturing Engineering Laboratory (MEL), in its Manufacturing Systems Integration Division (MSID): automating …

Report of the 82nd National Conference on Weights and Measures

November 1, 1997
Author(s)
B W. Palys
The 82nd Annual Meeting of the National Conference of Weights & Measures [NCWM], was held July 20 through July 24, 1997 at the Swiss hotel, Chicago, Illinois. The theme of the meeting was Fostering International Harmony in Legal Metrology. Reports by the

The Use of Vision and Touch Sensors for Dimensional Inspection Tasks

June 2, 1993
Author(s)
M Nashman
The purpose of dimensional inspection is to verify the geometry of a manufactured part. A machined part is either accepted or rejected based upon the sensed errors between the object and its specified geometry as defined in a CAD (Computer Aided Design)

The Use of Vision and Touch Sensors for Dimensional Inspection Tasks

April 1, 1992
Author(s)
M Nashman
The purpose of dimensional inspection is to verify the geometry of a manufactured part. A machined part is either accepted or rejected based upon the sensed errors between the object and its specified geometry as defined in a CAD (Computer Aided Design)

A Framework for Standard Modular Simulation: Application to Semiconductor Wafer Fabrication

June 1, 2005
Author(s)
J A. Ramirez-hernandez, H Li, E Fernandez, Charles R. McLean, Swee K. Leong
… the Mini-fab benchmark, Measurement and Improvement of Manufacturing Capacities (MIMAC) data set 1, and the … conducted by NIST, within the NIST's System Integration of Manufacturing Applications (SIMA) program, towards the standardization of data formats for simulation in manufacturing systems. …

A New Classification of Information: A Step on the Road to Interpretability

September 1, 2002
Author(s)
Larry H. Reeker, Albert W. Jones
… Complex systems, such as manufacturing supply chains, are often modeled as a … Information has played an important role in the manufacturing systems of the past. It will play a dominant role in the Internet-based manufacturing systems of the future. To better design, …

A New Classification of Information: A Step on the Road to Interoperability

July 1, 2002
Author(s)
Albert T. Jones, Larry H. Reeker
… Complex systems, such as manufacturing supply chains, are often modeled as a … Information has played an important role in the manufacturing systems of the past. It will play a dominant role in the Internet-based manufacturing systems of the future. To better design, …

Combustion Research Studies at the National Institute of Standards and Technology

January 1, 2000
Author(s)
Takashi Kashiwagi, William L. Grosshandler, Anthony P. Hamins, William M. Pitts, Cary Presser, Wing Tsang
… with broad economic potential; (3) a grassroots Manufacturing Extension Partnership with a nationwide network … are: Electronics and Electrical Engineering Laboratory, Manufacturing Engineering Laboratory, Chemical Science and …

Telepresence: A New Paradigm for Solving Contamination Problems

January 1, 1999
Author(s)
Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec
… the National Institute of Standards and Technology (NIST) Manufacturing Engineering Laboratory (MEL) is to improve and … Instruments,  under the auspices of the National Automated Manufacturing Testbed (NAMT) and in collaboration with the … of TPM within organizations having a large distributed manufacturing facility such as Texas Instruments (TI) and …

Telepresence: A New Paradigm for Solving Contamination Problems

January 1, 1999
Author(s)
Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec
… of the National Institute of Standards and Technology Manufacturing Engineering Laboratory is to improve and … Instruments, under the auspices of the National Automated Manufacturing Testbed and in collaboration with the … of TPM within organizations having a large distributed manufacturing facility such as Texas Instruments and between …

Nanomanufacturing: a perspective

February 10, 2016
Author(s)
James A. Liddle, Gregg M. Gallatin
… time to market. Here, taking silicon integrated circuit manufacturing as a baseline, we consider the factors involved … function can be made to follow form can enable high volume manufacturing of nanoscale structures with the desired …

Report of the 98th National Conference on Weights and Measures (2013)

March 31, 2014
Author(s)
Linda D. Crown, Tina G. Butcher, Richard A. Harshman, David A. Sefcik, Lisa Warfield
The 98th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 14 to 18, 2013, at the Seelbach Hilton Louisville, Louisville, Kentucky. The theme of the meeting was “On the Path to Tomorrow.” Reports by the NCWM Board of

Interoperability Testing for Shop Floor Measurement

December 28, 2007
Author(s)
Frederick M. Proctor, William G. Rippey, John A. Horst, Joseph Falco, Thomas Kramer
Manufactured parts are typically inspected to ensure quality. Inspection involves equipment and software from many different vendors, and interoperability is a major problem faced by manufacturers. The I++ Dimensional Measuring Equipment (DME)

Data Transfer Strategy for Machine Shop Simulation

July 1, 2005
Author(s)
Yung-Tsun Lee, Yan Luo
… Manufacturing simulation systems normally provide interfaces … data interfaces limit simulation applications in the manufacturing industry. This paper describes a mechanism for …

A Database Design for the Machine Shop Information Model

January 1, 2004
Author(s)
Yung-Tsun Lee, Yan Luo
… a database model currently under development at the Manufacturing System Integration Division (MSID) of the … Microsoft Access; it is used to support the integration of manufacturing applications and simulations for machine shops. …

Keeping Analytical Tools in Line with NTRS Goals: An Industry Challenge

January 1, 1999
Author(s)
Thomas J. Shaffner
… pushing sophisticated and costly metrology tools into the manufacturing environment. In a climate of limited resources, … these tools are in the critical path of IC development and manufacturing. The SIA National Technology Roadmap for …
Displaying 2201 - 2225 of 4212
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