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Displaying 1951 - 1975 of 4197

Report of the 85th National Conference on Weights and Measures

November 1, 2000
Author(s)
H V. Oppermann, J A. Koenig
The 85th Annual Meeting of the National Conference on Weights & Measures (NCWM), was held July 16 through July 20, 2000 at the Omni Richmond Hotel in Richmond, VA. The theme of the meeting was, Basic Standards-Builidng-the Foundation for a New Millennium

The Role of Standards in Innovation

July 1, 2000
Author(s)
Robert Allen, Ram D. Sriram
… in innovation, with particular emphasis on the design and manufacturing processes. We begin by defining and classifying … a study of four case histories in various domains - manufacturing, computer hardware, mechanical component … the benefits of standards on innovation in design and manufacturing outweigh the possible limitations on creativity …

Operationalizing Digital Twins in Biomanufacturing through Interoperable Process Analytical Technology

July 16, 2026
Author(s)
Abhijeet Satwekar, Cyndell Gracieux-Singleton, Veerabhadraiah Palakollu, Monica Acerbi, Ryan Barton, Chris Cummings, Allie Horton, Sandeep Kedia, Thomas Cornish, Katharina Yandrofski, Roger Hart, Dannielle Berlinghieri, James Saylor, Kelvin H. Lee
… represents a critical advancement in biopharmaceutical manufacturing. While existing literature has separately … digital twin dimensions, interoperability levels, and manufacturing standards, their systematic integration for … PAT systems in highly regulated biopharmaceutical manufacturing, with potential for broader application across …

Speed, the double edge sword of the Industry 4.0

October 31, 2022
Author(s)
Marion Toussaint, Sylvere Krima, Allison Barnard Feeney, Herve Panetto
… The recent digital transformation of the manufacturing world led to numerous benefits, from higher …

Array Based Test Structure for Optical-Electrical Overlay Calibration

March 22, 2007
Author(s)
Byron J. Shulver, Richard A. Allen, Anthony Walton, Michael W. Cresswell, J. T. Stevenson, S Smith, Andrew S. Bunting, P. Durgapal, Alan Gundlach, Les I. Haworth, Alan W. Ross, Anthony J. Snell
… then measured by the same tool that is being used in the manufacturing process being controlled. Thus it is … overlay which can not be routinely measured during the manufacturing operation. It allows optical overlay readings …

Harmonized Conformance Testing for Product Data Managers

October 1, 2001
Author(s)
David Flater, KC Morris
… The Testability of Interaction-Driven Manufacturing Systems project seeks to enhance the design-for-testability of specifications for manufacturing software interfaces, derive a test method that is usable for interaction-driven manufacturing systems in general, and foster the reuse of …

Incoporating Process Planning into Conceptual Design

September 1, 1999
Author(s)
Shaw C. Feng, Gordon A. Shaw, Walter W. Nederbragt, Serge Kaing, Ram D. Sriram
… planning in the early product design stage. Since major manufacturing costs are committed during product … paper reviews industry needs for an integrated design and manufacturing environment for rapid product development. …

Telepresence: A New Paradigm for Industrial and Scientific Collaboration

June 1, 1999
Author(s)
Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec
… (TI), under the auspices of the National Automated Manufacturing Testbed (NAMT) and in collaboration with the … of TPM within organizations having a large distributed manufacturing facility such as Texas Instruments and between … such as NIST, ANL, and UIC. Large distributed manufacturing sites such as TI need rapid response when …

System Requirements Analysis for the U.S. Army Rock Island Arsenal Tool Management System

March 1, 1990
Author(s)
Simon P. Frechette, Charles R. McLean
… The U.S. Army is conducting an extensive manufacturing modernization program at the Rock Island … of tool management is critical to the Army's manufacturing program. The purpose of this document is to … open architecture for tool management at the Rock Island manufacturing facility. …

Metrology and process control: dealing with measurement uncertainty

Author(s)
James E. Potzick
… Metrology is often used in designing and controlling manufacturing processes. A product sample is processed, some … effective for the complex processes used in semiconductor manufacturing, but there is some risk involved because … case? Or, How does measurement uncertainty relate to manufacturing risk? This paper looks at some of the …

The National PDES Testbed - An Overview

January 1, 1989
Author(s)
Cita M. Furlani
… generation o f data interchange standards for automated manufacturing, PDES is an ambitious project with the goal of …

Cements in the 21st Century: Challenges, Perspectives, and Opportunities

April 21, 2017
Author(s)
Joseph J. Biernacki, Jeffrey W. Bullard, Gaurav Sant, Nemkumar Banthia, Frederik P. Glasser, Scott Jones, Tyler Ley, Richard A Livingston, Luc Nicoleau, Jan Olek, Florence Sanchez, Rouzbeh Shahsavari, Paul E. Stutzman, Sobolev Konstantin, Tracie Prater
… cement, admixtures, additive manufacturing, sustainability …

Industrial Wireless Systems: Radio Propagation Measurements

January 30, 2017
Author(s)
Richard Candell, Catherine A. Remley, Jeanne T. Quimby, David R. Novotny, Alexandra Curtin, Peter B. Papazian, Galen H. Koepke, Joseph Diener, Mohamed T. Hany
… industrial wireless, manufacturing, RF propagation …
Displaying 1951 - 1975 of 4197
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