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NIST Authors in Bold

Displaying 3426 - 3450 of 4212

Integrating planar photonics for multi-beam generation and atomic clock packaging on chip

April 3, 2023
Author(s)
Chad Ropp, Wenqi Zhu, Alexander Yulaev, Daron Westly, Gregory Simelgor, Akash Rakholia, William Lunden, Dan Sheredy, Martin Boyd, Scott Papp, Amit Agrawal, Vladimir Aksyuk
The commercialization of atomic technologies requires replacing laboratory-scale laser setups with compact and manufacturable optical platforms. Complex arrangements of free-space beams can be generated on chip through a combination of integrated photonics

Smart Home Consumers' Privacy and Security Perceptions & Practices

December 7, 2020
Author(s)
Julie Haney, Susanne M. Furman, Yasemine Acar
Smart home technologies may expose adopters to increased risk to network security, information privacy, and physical safety. However, consumers may lack understanding of the privacy and security implications, while devices fail to provide transparency and

Ceramic Materials and Powder Diffraction

September 15, 2019
Author(s)
Winnie K. Wong-Ng
… exhibit similar features during processing and manufacturing (sintering and grain growth, texture, residual …

Model of Mobile Manipulator Performance Measurement using SysML

November 3, 2017
Author(s)
Roger V. Bostelman, Sebti Foufou, Tsai H. Hong, Mili Shah
Test methods for measuring safety and performance of mobile manipulators have yet to be developed. Therefore, potential mobile manipulator users cannot compare one system to another. Systems Modeling Language (SysML) is a general-purpose modeling language

Framework for Cyber-Physical Systems: Volume 3, Timing Annex

September 28, 2017
Author(s)
David A. Wollman, Marc A. Weiss, YaShian Li-Baboud, Edward R. Griffor, Martin J. Burns
… across multiple smart application domains, including smart manufacturing, transportation, energy, and healthcare. The …

Chapter 12 Depth profiling

September 17, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
… in materials, fault detection in construction and manufacturing, and the detection of hidden objects at secure …

A compact, thermal noise limited reference cavity for ultra-low noise microwave generation

March 23, 2017
Author(s)
Josue Davila-Rodriguez, Frederick N. Baynes, Andrew D. Ludlow, Tara M. Fortier, Holly F. Leopardi, Scott A. Diddams, Franklyn J. Quinlan
A 25 mm long, rigidly-held, ultra-stable optical frequency reference cavity is demonstrated. The cavity spacer has an easy-to-manufacture cylindrical shape which nonetheless exhibits a holding geometry predicted to be first-order insensitive to the

Enviromental Concerns Facing the Ceramics Industry

February 19, 2017
Author(s)
Stephen W. Freiman
Over the past few years, there has been increased attention paid by ceramic manufacturers in the United States to environmental issues facing their businesses. In a recent survey of its members, the environment was identified as the primary issue facing

Vector-Network-Analyzer Calibration Using Line and Multiple Coplanar-Waveguide Offset Reflects

December 9, 2016
Author(s)
Arkadiusz C. Lewandowski, Wojciech Wiatr, Dazhen Gu, Nate Orloff, Thomas Mitchell (Mitch) Wallis, Pavel Kabos
We present the application of our newly developed multi-reflect-thru technique to vector-network-analyzer calibration in the on-wafer environment. This technique uses a set of highly-reflective one-port devices, referred to as offset-reflects, and a single
Displaying 3426 - 3450 of 4212
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