Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 2601 - 2625 of 4197

Standards-based integration of advanced process control and optimization

October 28, 2018
Author(s)
Guodong Shao, Hasan Latif, Carla Martin, Peter O. Denno
… of process control with optimization is critical to Smart Manufacturing (SM). Oftentimes, however, the process control … process control and optimization (APC-O) capabilities for manufacturing systems. Guided by the standard, we modelled …

Framework for Cyber-Physical Systems: Volume 1, Overview

June 26, 2017
Author(s)
Edward R. Griffor, Christopher Greer, David A. Wollman, Martin J. Burns
… application areas include energy infrastructures, advanced manufacturing, building control, transportation, health care, … multiple “smart” application domains, including smart manufacturing, transportation, energy, and healthcare. The …

Framework for Cyber-Physical Systems: Volume 2, Working Group Reports

June 26, 2017
Author(s)
Edward R. Griffor, Christopher Greer, David A. Wollman, Martin J. Burns
… application areas include energy infrastructures, advanced manufacturing, building control, transportation, health care, … multiple “smart” application domains, including smart manufacturing, transportation, energy, and healthcare. The …

Does Your SEM Really Tell the Truth?

August 1, 2012
Author(s)
Michael T. Postek, Andras Vladar
… tool on semiconductor processing lines to monitor the manufacturing processes. The needs of semiconductor …

Traceable Calibration of a Critical Dimension Atomic Force Microscope

March 9, 2012
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Craig D. McGray, John E. Bonevich, Jon C. Geist
… of this sort are commonly encountered in semiconductor manufacturing and other nanotechnology industries. NIST has … budgets for typical measurands in semiconductor manufacturing metrology. A third generation CD-AFM was …

Industry Case Studies in the Use of Immersive Virtual Assembly

April 1, 2007
Author(s)
Sankar Jayaram, Uma Jayaram, Young J. Kim, Charles Dechenne, Kevin W. Lyons, Craig Palmer, Tatsuki Mitsui
… considerable participation from industry engineers and manufacturing shop floor personnel. Based on the success of … and test scenarios to deployment in the actual design and manufacturing cycle. However, in order to be truly accepted …

NIST Physical Standards for DNA-Based Medical Testing

January 1, 2002
Author(s)
Peter E. Barker, M S. Watson, J R. Ticehurst, Jennifer C. Colbert, C D. O'Connell
… physical standards in support of national commerce, manufacturing and science. In its role supporting U. S. …

Unified Process Specification Language: Requirements for Modeling Process

January 1, 1996
Author(s)
Craig I. Schlenoff, Amy Knutilla, Steven R. Ray
… reengineering, product realization process modeling, manufacturing process planning, production scheduling, … the process representational requirements for design/manufacturing process life-cycle applications. These …
Displaying 2601 - 2625 of 4197
Was this page helpful?