Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 1251 - 1275 of 7107

Simple Test Procedure for Image-Based Biometric Verification Systems

May 1, 1999
Author(s)
Charles L. Wilson, R. McCabe
This report discusses a simple test method for image-based biometric verification systems. A fingerprint based computer login system is used as an example of the process used in this test method. Ideally, these tests should be performed on standard

IPPS: An Integrated Process Planning System

May 4, 2004
Author(s)
Suber Huang, J Mei, Xuhang Tong, Steven R. Ray
The past two decades have witnessed the development of many CAPP (Computer-Aided Process Planning) systems. From variant process planning to generative process planning, great progress has been made. However, due to the complexity of the problems involved

Decoherence of a Superconducting Qubit due to Bias Noise

March 25, 2003
Author(s)
John M. Martinis, Sae Woo Nam, Joe Aumentado, Kristine Lang, C Urbina
We calculate for the current-biased Josephson junction the decoherence of the qubit state from noise and dissipation. The effect of dissipation can be entirely accounted for through a noise model of the current bias that appropriately includes the effect

Segmentation of Addictive Manufacturing Defects Using U-Net

August 17, 2021
Author(s)
Vivian Wong, Max Ferguson, Kincho Law, Yung-Tsun Lee, Paul Witherell
Additive manufacturing (AM) provides design flexibility and allows rapid fabrications of parts with complex geometries. The presence of internal defects, however, can lead to deficit performance of the fabricated part. X-ray Computed Tomography (XCT) is a

Implementation of SDR TWSTFT in UTC Computation

January 30, 2018
Author(s)
Zhiheng Jiang, Felicitas Arias, Victor S. Zhang, Yi-Jiun Huang, Joseph Ackhar, Dirk Piester, Shinn-Yan Lin, Wenjun Wu, Andrey Naumov, Sung-hoon Yang, Jerzy Nawrocki, Ilaria Sesia, Christian Schlunegger, Kun Liang
… Implementation of SDR TWSTFT in UTC Computation

Beyond Product Design Data: Data Standards for Manufacturing Resources

August 1, 1996
Author(s)
Kevin K. Jurrens, Mary B. Algeo, James E. Fowler
The benefits of industrial standards are well-known. They facilitate common markets, influence marketing patterns, and augment the operations of distributed enterprises. Standards for representing, using and exchanging manufacturing data, like standards
Displaying 1251 - 1275 of 7107
Was this page helpful?