December 7, 2016
Author(s)
Joseph A. Hagmann, Xiqiao Wang, Pradeep N. Namboodiri, Richard M. Silver, Curt A. Richter
… tunnel microscope which can pattern device features on a hydrogen-terminated silicon surface by exposing Si dangling … (STM), transmission electron microscopy (TEM), secondary ion mass spectrometry (SIMS), and directly correlated with …