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Displaying 2426 - 2450 of 2934

Simulations of Optical Microscope Images

July 3, 2006
Author(s)
Thomas A. Germer, Egon Marx
The resolution of an optical microscope is limited by the optical wavelengths used. However, there is no fundamental limit to the sensitivity of a microscope to small differences in any of a feature's dimensions. That is, those limits are determined by

Ultraviolet Laser Damage of Carbon Nanotube Coatings on Thermal Detector Platforms

November 14, 2005
Author(s)
Darryl A. Keenan, Natalia Varaksa, Anne Dillon, Chaiwat Engtrakul, Stephen E. Russek, John H. Lehman
We have initiated a program to demonstrate the next generation of optical detector coatings using carbon nanotubes (CNTs). These coatings have been used on a variety of detector platforms for laser power and energy measurement standards. These coatings

Serrated Chip Morphology and Comparison with Finite Element Simulations

November 1, 2004
Author(s)
Laurent Deshayes, Robert W. Ivester, T Mabrouki, J F. Rigal
The complexity of chip formation in machining processes stems from the confluence of several physical phenomena - mechanical, thermal, and chemical - occurring at very high strain rate. The prediction of chip morphology depends on a fundamental

Microstructure-Based Simulation of Thermomechanical Behavior of Composite Materials by Object-Oriented Finite Element Analysis

December 1, 2002
Author(s)
N Chawla, B V. Patel, M Koopman, K K. Chawla, R Saha, B R. Patterson, Lin-Sien H. Lum, Stephen A. Langer
While it is well recognized that microstructure controls the physical and mechanical properties of a material, the complexity of the microstructure often makes it difficult to simulate by analytical or numerical techniques. In this paper we present a

A New Classification of Information: A Step on the Road to Interpretability

September 1, 2002
Author(s)
Larry H. Reeker, Albert W. Jones
Complex systems, such as manufacturing supply chains, are often modeled as a collection of interacting components with information flows between them. These components are frequently responsible for making a wide range of decisions that are implemented

A New Classification of Information: A Step on the Road to Interoperability

July 1, 2002
Author(s)
Albert T. Jones, Larry H. Reeker
Complex systems, such as manufacturing supply chains, are often modeled as a collection of interacting components with information flows between them. These components are frequently responsible for making a wide range of decisions that are implemented

Confinement Effects on the Spatial Extent of the Reaction Front in Ultrathin Chemically Amplified Photoresists

December 1, 2001
Author(s)
D L. Goldfarb, M Angelopoulos, Eric K. Lin, Ronald L. Jones, Christopher Soles, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Wen-Li Wu
Sub-100 nm lithography poses strict requirements on photoresist material properties and processing conditions to achieve necessary critical dimension (CD) control of patterned structures. As resist thickness and feature linewidth decrease, fundamental

Large-Area TKIDs for a New Generation of Neutron Beta Decay Experiments

January 1, 2001
Author(s)
Elizabeth Scott, Jimmy P. Caylor, Maynard S. Dewey, Jiansong Gao, Colin A. Heikes, Shannon Hoogerheide, Hans Pieter Mumm, Jeffrey S. Nico, Joel Ullom, Michael Vissers
Nuclear physics has long played a central role in our efforts to better understand the natural world. Several experiments are well positioned to improve limits in searches for physics Beyond the Standard Model (BSM). Many of the experiments in nuclear

What Is This Thing Called Conformance?

December 1, 2000
Author(s)
Lynne S. Rosenthal, Mary C. Brady
XML developers claim they do it. OASIS, NIST, and W3C are building it. And, standards often require it. What is it?Conformance is usually defined as a way to determine if an implementation faithfully meets the requirements of a standard or specification

Color Issues of White LEDs

October 1, 2000
Author(s)
Yoshihiro Ohno
… as well as for the source efficacy. In this section, some fundamentals of the CIE colorimetry system including the …

High Resolution g-Ray Spectroscopy: the First 85 Years

January 1, 2000
Author(s)
R Deslattes
This opening review attempts to follow the main trends in crystal diffraction spectrometry of nuclear γ-rays from its 1914 beginning in Rutherford's laboratory to the ultra-high resolution instrumentation realized in the current generation of spectrometers

A Methodology for Integrating Sensor Feedback in Machine Tool Controllers

June 30, 1992
Author(s)
Frederick M. Proctor, John L. Michaloski, Thomas Kramer
A reference model architecture for real-time hierarchical control systems has been proposed by researchers at the National Institute of Standards and Technology, and has been implemented on a variety of computing platforms for manufacturing and vehicle

The trace of heat: on the predictive power of modeling transient diffusion

June 26, 2025
Author(s)
Vijaya Holla, Timothy Redford, Philipp Kopp, Stefan Kollmannsberger
The paper at hand evaluates the validity of the transient heat equation with phase change and temperature-dependent coefficients as a model to predict the evolution of melt pools for rapid turnaround scan strategies in a laser powder bed fusion (PBF-LB)
Displaying 2426 - 2450 of 2934
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