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NIST Authors in Bold

Displaying 2251 - 2275 of 2958

Optical Frequency Standards and Their Measurement

October 16, 2008
Author(s)
John L. Hall, Jun Ye
The last four years have seen a revolution in the art and practice of optical frequency measurement. Indeed the gearbox represented by the spectrally-broadened fs laser's comb has sufficiently low noise that we in the optics community have abruptly found

Attenuation of Radio Wave Signals Coupled Into Twelve Large Building Structures

August 1, 2008
Author(s)
Christopher L. Holloway, William F. Young, Galen H. Koepke, Catherine A. Remley, Dennis G. Camell, Yann Becquet
In this report, we investigate radio communication problems faced by emergency responders (firefighters, police and emergency medical personnel) in disaster situations. A fundamental challenge to communications into and out of large buildings is the strong

High-performance carbon nanotube coatings for high-power laser radiometry

January 3, 2008
Author(s)
Krishna Ramadurai, Christopher L. Cromer, Laurence A. Lewis, Katie Hurst, Anne Dillon, Roop Mahajan, John H. Lehman
Radiometry for the next generation of high-efficiency, high-power industrial lasers requires thermal management at optical power levels exceeding 10 kW. Laser damage and thermal transport present fundamental challenges for laser radiometry in support of

Photoconductive lifetimes of carbon nanotubes films

November 29, 2007
Author(s)
Katie Hurst, Richard K. Ahrenkiel, Steve W. Johnston, Anne Dillon, Lara Roberson, John H. Lehman
The photoconductive recombination lifetimes of carbon nanotube (CNT) thin films as a function of wavelength are measured by resonant-coupled photoconductive decay (RCPCD) method (1). The carrier recombination lifetime is a fundamental property of carbon

Conformance Checking of Access Control Policies Specified in XACML

July 24, 2007
Author(s)
Vincent C. Hu, Evan Martin, Tao Xie
Access control is one of the most fundamental and widely used security mechanisms. Access control mechanisms control which principals such as users or processes have access to which resources in a system. To facilitate managing and maintaining access

Microwave Optoelectronic Oscillator with Optical Gain

May 29, 2007
Author(s)
Craig W. Nelson, Archita Hati, David A. Howe, W Zhou
Optoelectronic oscillators (OEO) are unique compared to radio-frequency (RF) oscillators in that they do not fundamentally require a RF gain element in order to satisfy the amplitude threshold condition for oscillation. All the energy required for

Microwave optoelectronic oscillator with optical gain

May 29, 2007
Author(s)
Craig Nelson, Archita Hati, David A. Howe, W Zhou
Optoelectronic oscillators (OEO) are unique compared to radio-frequency (RF) oscillators in that they do not fundamentally require a RF gain element in order to satisfy the amplitude threshold condition for oscillation. All the energy required for

Rheology Measurement of Fresh concrete With a Mixing Truck

November 2, 2005
Author(s)
S Amziane, Chiara C. Ferraris, E Koehler
The main objective of this study is to evaluate the workability of fresh portland cement concrete while it is still in the mixing truck by determining fundamental rheological parameters (plastic viscosity and yield stress). Nine concrete mixtures with

Measurement of Workability of Fresh Concrete Using a Mixing Truck

March 1, 2005
Author(s)
S Amziane, Chiara C. Ferraris, E Koehler
The main objective of this study is to evaluate the workability of fresh portland cement concrete while it is still in the mixing truck by determining fundamental rheological parameters (plastic viscosity and yield stress). Nine concrete mixtures with

Standard Reference Materials--the First Century

January 1, 2003
Author(s)
S D. Rasberry
Over the course of its first one hundred years, the National Institute of Standards and Technology (NIST) has made numerous contributions to advancing the science and practice of measurements. Contributions to fundamental constants and reference data, such

Measured cross sections and ion energies for a CHF 3 discharge.

August 1, 2002
Author(s)
B. Peko, R. Champion, MVVS. Rao, James K. Olthoff
Trifluoromenthane (CHF 3) is used in semiconductor plasma processing chambers to achieve high etch selectivity of an oxide layer over a silicon substrate. Such surface etching is governed by the ion and molecule fluxes near the surface, the concentrations

Special Issue - Crystallography at NIST/NBS

December 1, 2001
Author(s)
Alan D. Mighell, Winnie K. Wong-Ng
The Centennial Celebration of the National Institute of Standards and Technology (NIST), formerly known as the National Bureau of Standards (NBS), takes place in the year 2001. NIST has a long history (> 50 years) of crystallographic research, and has made

Single Molecule Probes

August 1, 2001
Author(s)
Lori S. Goldner, K D. Weston, W F. Heinz, Jeeseong Hwang, E S. DeJong, John P. Marino
The technology to rapidly manipulate and screen individual molecules lies at the frontier of measurement science and impacts emerging bio- and nano-technologies. Fundamental biological and chemical processes can now be probed with unprecedented detail, one

The Application of High-Speed CNC Machining to Prototype Production

June 1, 2001
Author(s)
Tony L. Schmitz, Matthew A. Davies, Brian S. Dutterer, J C. Ziegert
To reduce delays in the design and manufacture of a new part, rapid prototyping is often employed to minimize lead times. In this paper, the application of high-speed machining to the production of monolithic, metallic, functional prototypes is discussed

On-Wafer Measurement of Transmission Lines On Lossy Silicon Substrates

September 25, 2000
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
This paper examines broadband measurement techniques for electrical properties of planar transmission lines built on lossy silicon substrates. We start by investigating the performance of a new formulation of the calibration com-parison method which is
Displaying 2251 - 2275 of 2958
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