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NIST Authors in Bold

Displaying 2251 - 2275 of 2934

Special Issue - Crystallography at NIST/NBS

December 1, 2001
Author(s)
Alan D. Mighell, Winnie K. Wong-Ng
The Centennial Celebration of the National Institute of Standards and Technology (NIST), formerly known as the National Bureau of Standards (NBS), takes place in the year 2001. NIST has a long history (> 50 years) of crystallographic research, and has made

Single Molecule Probes

August 1, 2001
Author(s)
Lori S. Goldner, K D. Weston, W F. Heinz, Jeeseong Hwang, E S. DeJong, John P. Marino
The technology to rapidly manipulate and screen individual molecules lies at the frontier of measurement science and impacts emerging bio- and nano-technologies. Fundamental biological and chemical processes can now be probed with unprecedented detail, one

The Application of High-Speed CNC Machining to Prototype Production

June 1, 2001
Author(s)
Tony L. Schmitz, Matthew A. Davies, Brian S. Dutterer, J C. Ziegert
To reduce delays in the design and manufacture of a new part, rapid prototyping is often employed to minimize lead times. In this paper, the application of high-speed machining to the production of monolithic, metallic, functional prototypes is discussed

On-Wafer Measurement of Transmission Lines On Lossy Silicon Substrates

September 25, 2000
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
This paper examines broadband measurement techniques for electrical properties of planar transmission lines built on lossy silicon substrates. We start by investigating the performance of a new formulation of the calibration com-parison method which is

Surveying Through Solid Walls

June 8, 1997
Author(s)
William C. Stone
A good metrology system in the automated environment must (1) measure the three dimensional position and attitude of any component to a reasonable degree of accuracy; (2) acquire these data fairly rapidly; and (3) be capable of making reliable measurements

NIST Neutron Source Pre-Conceptual Design

February 10, 2025
Author(s)
David Diamond, Abdullah Weiss, Osman Celikten, Jeremy Cook, Dagistan Sahin, Hubert King, Anil Gurgen, Joy Shen
A pre-conceptual design has been completed for a NIST Neutron Source (NNS). It would replace the existing facility at the NIST Center for Neutron Research (NCNR) to enable significantly more thermal and cold neutrons to be used in many more experiments

Report on High Energy Arc Fault Experiments: Experimental Results from Medium Voltage Electrical Enclosures

November 29, 2021
Author(s)
Gabriel Taylor, Anthony D. Putorti Jr., Scott Bareham, Edward Hnetkovsky, Kenneth Hamburger, Nicholas Melly, Mark Henry Salley, Christopher U. Brown, Wai Cheong Tam, Eric Link, Michael Selepak, Philip Deardorff, Kenneth Miller, Paul Clem, Byron Demosthenous, Austin Glover, Chris LaFleur, Raymond Martinez, Anthony Tanbakuchi
This report documents an experimental program designed to investigate High Energy Arcing Fault (HEAF) phenomena for medium voltage electrical switchgear containing aluminum conductors. This report covers full-scale laboratory experiments using

Setting Kinetics of Calcium Phosphate Cement by Dielectric Spectroscopy

October 16, 2008
Author(s)
H J. Mueller, R W. Hirthe
Calcium phosphate cements (CPC) are useful because of their excellent biocompatibility and self-hardening behavior. The setting reaction involving equimolar quantities of tetracalcium phosphate (TTCP, Ca4(PO4)2O) and dicaalcium phosphate anhydrous (DCPA

Workshop on Reliability Issues in Nanomaterials

August 1, 2005
Author(s)
Robert Keller, David T. Read, Roop L. Mahajan
The Workshop on Reliability Issues in Nanomaterials was held at the Boulder Laboratories of the National Institute of Standards and Technology (NIST) on August 17-19, 2004. It was designed to promote a particular subset of NIST?s responsibilities under the

Material Needs and Measurement Challenges for Advanced Semiconductor Packaging: Understanding the Soft Side of Science

August 27, 2025
Author(s)
Ran Tao, Polette Centellas, Stian Romberg, Anthony Kotula, Gale Holmes, Amanda Forster, Christopher Soles, Bob Allen, Edvin Cetegen, William Chen, Jeff Gotro, Mark Poliks
This perspective builds upon insights from the National Institute of Standards and Technology (NIST)-organized workshop, "Materials and Metrology Needs for Advanced Semiconductor Packaging Strategies," held at the 35th annual Electronics Packaging

Neutron Vibrational Spectroscopic Study of the Acetonitrile:Acetylene (1:2) Cocrystal Relevant to Titan, Saturn's Moon

November 13, 2024
Author(s)
Morgan Kramer, Luke Daemen, Yongqiang Cheng, Rafael Balderas-Xicohtencatl, Anibal Ramirez-Cuesta, Craig Brown, Tomce Runcevski
Saturn's moon Titan features a surface composed of various organic solids with pronounced compositional and structural diversity. On top of the icy core, the surface experiences a temperature of ≈93 K and pressure of ≈1.45 atm. Under these conditions, most

On Comparing Interference Impacts

October 9, 2024
Author(s)
Aric Sanders, Michelle Pirrone, Keith Forsyth, Adam Wunderlich
Interference between communication systems is a critical issue that can impact performance and operability of devices. A wide range of methods and testbeds have been developed to study susceptibility to interference, and each of these testbeds and their

Cryogenic Sapphire Optical Reference Cavity with 1 x 10^-16 fractional instability

October 2, 2024
Author(s)
Jose Valencia, George Iskandr, Nicholas Nardelli, David Leibrandt, David Hume
The frequency stability of a laser locked to an optical reference cavity is fundamentally limited by thermal noise in the cavity length, caused by local thermal fluctuations of the strain and index of refraction of the cavity components. These fluctuations

Quality Control in the Mass Spectrometry Proteomics Core: a Practical Primer

September 11, 2024
Author(s)
Ben Neely, Yasset Perez-Riverol, Magnus Palmblad
The past decade has seen widespread advances in quality control (QC) materials and software tools focused specifically on mass spectrometry–based proteomics, yet the rate of adoption is inconsistent. Despite the fundamental importance of QC, it typically
Displaying 2251 - 2275 of 2934
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