Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 2101 - 2125 of 2958

Efficient qubit measurement with a nonreciprocal microwave amplifier

January 13, 2021
Author(s)
Florent Lecocq, Leonardo Ranzani, Gabriel A. Peterson, Katarina Cicak, Xiaoyue Jin, Raymond Simmonds, John Teufel, Jose Aumentado
The act of observing a quantum object fundamentally perturbs its state, resulting in a random walk toward an eigenstate of the measurement operator. Ideally, the measurement is responsible for all dephasing of the quantum state. In practice, imperfections

Exchange Bias Switching in an Antiferromagnet/Ferromagnet Bilayer Driven by Spin-Orbit Torque

December 1, 2020
Author(s)
Shouzhong Peng, Daoqian Zhu, Weixiang Li, Hao Wu, Alexander Grutter, Dustin A. Gilbert, Jiaqi Lu, Danrong Xiong, Wenlong Cai, Padraic Shafer, Kang L. Wang, Weisheng Zhao
Electrical manipulation of exchange bias and magnetization in antiferromagnet/ferromagnet thin films has been of great interest in recent years. Here, we experimentally demonstrate current-induced switching of exchange bias in perpendicularly magnetized

Revealing thermodynamics of DNA origami folding via affine transformations

June 4, 2020
Author(s)
Jacob M. Majikes, Paul N. Patrone, Daniel R. Schiffels, Michael P. Zwolak, Anthony J. Kearsley, Samuel P. Forry, James A. Liddle
Structural DNA nanotechnology, as exemplified by DNA origami, has enabled the design and construction of molecularly precise objects for a myriad of applications. However, limitations in imaging, and other characterization approaches, make a quantitative

Long-Range Magnetic Order in Hydroxide-Layer-Doped (Li 1-x-y Fe x Mn y OD)FeSe

March 11, 2020
Author(s)
Brandon Wilfong, Xiuquan Zhou, Huafei Zheng, Navneeth Babra, Craig Brown, Jeffrey W. Lynn, Keith M. Taddei, Johnpierre Paglione, Efrain E. Rodriguez
The (Li 1-xFe xOH)FeSe superconductor has been suspected to exhibit long-range magnetic ordering due to Fe substitution in the LiOH layer. However, no direct observation such as magnetic reflection from neutron diffraction has be reported. Here, we use a

Phase Field Benchmark Problems Targeting Fluid Flow and Electrochemistry

January 28, 2020
Author(s)
Andrea Jokisaari, Wenkun Wu, P W. Voorhees, Jonathan E. Guyer, James A. Warren, Olle G. Heinonen
In this work, a third set of benchmark problems for phase field models are presented. These problems are being jointly developed by the Center for Hierarchical Materials Design (CHi- MaD) and the National Institute of Standards and Technology (NIST) along

NIST Big Data Interoperability Framework: Volume 4, Security and Privacy

October 21, 2019
Author(s)
Wo L. Chang, Arnab Roy, Mark Underwood
Big Data is a term used to describe the large amount of data in the networked, digitized, sensor-laden, information-driven world. While opportunities exist with Big Data, the data can overwhelm traditional technical approaches and the growth of data is

NIST Big Data Interoperability Framework: Volume 6, Reference Architecture

October 21, 2019
Author(s)
Wo L. Chang, David Boyd, Orit Levin
Big Data is a term used to describe the large amount of data in the networked, digitized, sensor-laden, information-driven world. While opportunities exist with Big Data, the data can overwhelm traditional technical approaches, and the growth of data is

Guide for Security-Focused Configuration Management of Information Systems

October 11, 2019
Author(s)
Arnold Johnson, Kelley L. Dempsey, Ronald S. Ross, Sarbari Gupta, Dennis Bailey
[Includes updates as of October 10, 2019] Guide for Security-Focused Configuration Management of Information Systems provides guidelines for organizations responsible for managing and administering the security of federal information systems and associated

Nanobolometer with ultralow noise equivalent power

October 11, 2019
Author(s)
Roope J. Kokkoniemi, Joonas Govenius, Visa Vesterinen, Russell Lake, A M. Gunyho, K-Y Tan, S Simbierowicz, Leif Gronberg, J Lehtinen, M Prunnila, Juha Hassel, Antti Lamminen, O P. Saira, Mikko Mottonen
Since the introduction of bolometers more than a century ago, they have been used in various applications ranging from chemical sensors, consumer electronics, and security to particle physics and astronomy. However, faster bolometers with lower noise are

Data-driven approaches to optical patterned defect detection

September 5, 2019
Author(s)
Mark-Alexander Henn, Hui Zhou, Bryan M. Barnes
Computer vision and classification methods have become increasingly popular in recent years due to ever-increasing computation power. While advances in semiconductor devices are the basis for this growth, few publications have probed the benefits of data

A Review Of Machine Learning Applications In Additive Manufacturing

August 17, 2019
Author(s)
Saadia A. Razvi, Shaw C. Feng, Anantha Narayanan Narayanan, Yung-Tsun Lee, Paul Witherell
Variability in product quality continues to pose a major barrier to the widespread application of additive manufacturing (AM) processes in production environment. Towards addressing this barrier, the monitoring of AM processes and the measuring of AM

Development of a new UHV/XHV pressure standard (Cold Atom Vacuum Standard)

November 10, 2017
Author(s)
Julia Scherschligt, James A. Fedchak, Daniel Barker, Stephen Eckel, Nikolai Klimov, Constantinos Makrides, Eite Tiesinga
The National Institute of Standards and Technology has recently begun a program to develop a primary pressure standard that is based on ultra-cold atoms, covering a pressure range of 1 × 10-6 Pa to 1 × 10-10 Pa and possibly lower. These pressures

Chapter 4. On-wafer measurements of RF nanoelectronic devices

September 15, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
The preceding chapters have introduced the core concepts and techniques of microwave measurements, in general, and techniques for microwave measurements of extreme impedance devices, in particular. Here, we narrow the focus further to on-wafer, microwave

Morphological characterization of fullerene and fullerene-free organic photovoltaics by combined real and reciprocal space techniques

May 26, 2017
Author(s)
Donglin Zhao, Qinghe Wu, Luping Yu, Harald Ade, Dean DeLongchamp, Lee J. Richter, Subhrangsu Mukherjee, Andrew Herzing
Morphology can play a critical role in determining function in organic photovoltaic (OPV) systems. Recently molecular acceptors have showed promise to replace¬ fullerene derivatives as acceptor materials in bulk heterojunction solar cells and have achieved
Displaying 2101 - 2125 of 2958
Was this page helpful?