Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

One-dimensional frequency-based spectroscopy

Published

Author(s)

Joseph T. Hodges, A. Cygan, P. Wcislo, S. Wojtewicz, Piotr Maslowski, R. Ciurylo, D Lisak

Abstract

Recent developments in optical metrology have tremendously improved the precision and accuracy of the horizontal (frequency) axis in measured spectra. However, the vertical (typically absorbance) axis is usually based on intensity measurements that are subject to instrumental errors which limit the spectrum accuracy. Here we report a one-dimensional dispersion method that uses only the measured frequencies of high-finesse cavity modes to provide complete information about the absorptive and dispersive properties of the spectrum. Because this technique depends solely on the measurement of optical frequency differences, it is insensitive to systematic errors in the detection of light intensity and has the potential to become the most accurate method for measuring absorption and dispersion spectra. The experimental results are compared to measurements by two other high-precision cavity-enhanced spectroscopy methods. We expect that the proposed technique will have significant impact in fields such as fundamental physics, gas metrology and environmental remote sensing.
Citation
Nature Photonics

Keywords

cavity-enhanced spectroscopy, resonant cavity, cavity ring-down spectroscopy, frequency metrology

Citation

Hodges, J. , Cygan, A. , Wcislo, P. , Wojtewicz, S. , Maslowski, P. , Ciurylo, R. and Lisak, D. (2015), One-dimensional frequency-based spectroscopy, Nature Photonics, [online], https://doi.org/10.1364/OE.23.014472 | (Accessed December 7, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 22, 2015, Updated November 10, 2018