Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 1376 - 1400 of 2915

X-Ray Spectrometer Having 12 000 Resolving Power at 8 keV Energy

May 14, 2018
Author(s)
Lawrence T. Hudson, John F. Seely, Uri Feldman, Albert Henins
An x-ray spectrometer employing a thin (50 μm) silicon transmission crystal was used to record high-resolution Cu Kα spectra from a laboratory x-ray source. The diffraction was from the (331) planes that were at an angle of 13.26° to the crystal surface

Testing of Cementitious Materials Using a Dynamic MEMS Micro Rheometer

May 17, 2016
Author(s)
Yong Sik Kim, Nicholas G. Dagalakis, Chiara C. Ferraris, Nicos Martys
Incompatibility of cementitious materials with admixtures often requires time consuming testing. Usually, several mixtures need to be prepared either using concrete or paste to determine the optimum high range water reducer dosage (HRWRA) and type. The

Forward Issue on Electrochemical Processing of Interconnects

December 10, 2013
Author(s)
Thomas P. Moffat, Daniel Josell
On-going densification of microelectronics has driven the development of cost effective and reliable processes for fabricating circuitry ranging from nanometer scale trenches and vias for on-chip interconnects to micrometer scale through-silicon-vias (TSV)

Development of a MEMS based Dynamic Rheometer

August 31, 2010
Author(s)
Gordon Christopher, Jae M. Yoo, Nicholas G. Dagalakis, Steven D. Hudson, Kalman D. Migler
Rheological methods that interrogate nano-liter scale volumes of fluids and solids have advanced considerably over the past decade, yet there remains a need for methods that probe the frequency dependent complex rheological moduli through application of

Electrodeposition of Metastable Au-Ni Alloys

May 13, 2010
Author(s)
Gery R. Stafford, E. Rouya, Ugo Bertocci, J. J. Mallett, R. Schad, M. R. Begley, R. G. Kelly, M. Reed, G. Zangari
… electrolytes derived from a commercial bath for soft gold plating is investigated. Alloy compositions ranging from 0 …

Cracking in Brittle Laminates from Concentrated Loads

June 1, 2002
Author(s)
H Chai, Brian R. Lawn
A study is made of the crack resistance of multilaminates consisting of brittle layers interleaved with compliant interlayers and bonded to compliant substrates. Specific attention is paid to flexure generated radial cracks in the undersurfaces of

Carbon Nanotube-Based Black Coatings

February 15, 2018
Author(s)
John H. Lehman, Christopher S. Yung, Nathan A. Tomlin, Davis R. Conklin, Michelle S. Stephens
… We briefly describe a history of other coatings such as nickel phosphorous, gold black and carbon-based paints and …

Supercontinuum Sources for Metrology

June 2, 2009
Author(s)
John T. Woodward IV, Allan W. Smith, Colleen A. Jenkins, Chungsan Lin, Steven W. Brown, Keith R. Lykke
Supercontinuum (SC) sources are novel laser-based sources that generate a broad, white-light continuum in single mode photonic crystal fibers. Currently, up to 6 W of optical power is available, spanning the spectral range from 460 nm to 2500 nm. Advances

Microfluidic Interfacial Tensiometry

August 1, 2005
Author(s)
Steven D. Hudson, J Cabral, Wenhua Zhang, Jai A. Pathak, Kathryn L. Beers
Immiscible fluids find diverse applications, yet their interfacial tension σ remains a fundamental property that governs their performance. Therefore, accurate and efficient methods to measure interfacial tension facilitate development and refinement of

Quantum Control, Quantum Information Processing, and Quantum-Limited Metrology With Trapped Ions

June 19, 2005
Author(s)
David J. Wineland, Dietrich G. Leibfried, Murray D. Barrett, A. Ben-Kish, James C. Bergquist, Brad R. Blakestad, John J. Bollinger, Joseph W. Britton, J Chiaverini, B. L. DeMarco, David Hume, Wayne M. Itano, M J. Jensen, John D. Jost, Emanuel H. Knill, Jeroen Koelemeij, C. Langer, Windell Oskay, R Ozeri, Rainer Reichle, Till P. Rosenband, Tobias Schaetz, Piet Schmidt, Signe Seidelin
We briefly discuss recent experiments on quantum informaiton processing using trapped ions at NIST. A central theme of this work has been to increase our capabilities in terms of quantum computing protocols, but we have also been interested in applying the
Displaying 1376 - 1400 of 2915
Was this page helpful?