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NIST Authors in Bold

Displaying 1001 - 1025 of 2964

Report on High Energy Arcing Fault Experiments - Experimental Results from Open Box Enclosures

December 29, 2021
Author(s)
Gabriel Taylor, Anthony D. Putorti Jr., Scott Bareham, Christopher U. Brown, Wai Cheong Tam, Edward Hnetkovsky, Andre Thompson, Michael Selepak, Philip Deardorff, Kenneth Hamburger, Nicholas Melly, Kenneth Miller, Kenneth Armijo, Paul Clem, Alvaro Cruz-Cabrera, Byron Demosthenous, Austin Glover, Chris LaFleur, Raymond Martinez, James Taylor, Rana Weaver, Caroline Winters
This report documents an experimental program to investigate High Energy Arcing Fault (HEAF) phenomena. The experiments provide data to better characterize the arc to improve the prediction of arc energy emitted during a HEAF event. An open box allows for

Behaviour of high-strength bolts at elevated temperatures under double-shear loading

September 13, 2017
Author(s)
Mina S. Seif, Jonathan M. Weigand, Rafaela Peixoto, Luiz Vieira
During fire events, connections in steel structures may be subjected to large unanticipated deformations and loads. Those fire effects can produce failures of connections, including local buckling of the connection zone, rupture of connection plates, shear

Whisker & Hillock Formation on Sn, Sn-Cu and Sn-Pb Electrodeposits

November 11, 2005
Author(s)
William J. Boettinger, C E. Johnson, Leonid A. Bendersky, Kil-Won Moon, Maureen E. Williams, Gery R. Stafford
… Cantilever beam deflection measurements within 15 min of plating proved that all electrodeposits had in-plane … Pb particles within supersaturated Sn grains shortly after plating. Longer time changes in beam deflection (15 min to 1 …

Accuracy and Versatility of the NIST M48 Coordinate Measuring Machine

October 1, 2001
Author(s)
John R. Stoup, Theodore D. Doiron
The NIST Is continuing to develop the ability to perform accurate, traceable measurements on a wide range of artifacts using a very precise, error-mapped coordinate measuring machine (CMM). The NIST M48 CMM has promised accuracy and versatility for many

Development of an automated millifluidic platform and data-analysis pipeline for rapid electrochemical corrosion measurements: a pH study on Zn-Ni

July 25, 2022
Author(s)
Howard Joress, Brian DeCost, Najlaa Hassan, Trevor Braun, Justin Gorham, Jason Hattrick-Simpers
We describe the development of a millifluidic based scanning droplet cell platform for rapid and automated corrosion. This system allows for measurement of corrosion properties (e.g., open circuit potential, corrosion current through Tafel and linear

An Ontological Modeling Platform

June 4, 2008
Author(s)
V.C. Liang, Conrad E. Bock, XuanFang Zha
The Ontological Modeling Platform described in this paper is a class library for extended ontological operations, to support extension of ontology languages, composition of interconnected elements, and high-level product modeling services, such as

Mode-selective acoustic spectroscopy of trigonal piezoelectric crystals

May 1, 2008
Author(s)
Ward L. Johnson, Carlos F. Martino, Sudook A. Kim, Paul R. Heyliger
A noncontacting electromagnetic-acoustic-resonance technique is presented for generating and detecting vibrational modes with prescribed symmetries in piezoelectric trigonal crystals with cylindrical geometry. This technique provides the experimental basis

2-D Imaging of Temperature in CF 4 Plasmas

April 1, 2005
Author(s)
Kristen L. Steffens, Mark A. Sobolewski
Two-dimensional maps of rotational temperature were determined in CF4 plasmas using planar laser-induced fluorescence of CF. Experiments were performed in a capacitively-coupled, parallel plate plasma reactor at pressures from 200mTorr (26.7Pa) to 800mTorr

The Boundary of X-Ray and Electron Tomography

January 3, 2005
Author(s)
Zachary H. Levine
Samples a few micrometers in total size offer a challenge to both x-ray and electron tomography. X-ray tomography originated imaging the human body with millimeter resolution, but the resolution has been reduced by over 7 orders of magnitude by the use of

Electrometrology and NIST -- New Directions

July 1, 2001
Author(s)
William E. Anderson
I gaze into a somewhat cloudy crystal ball to predict the directions of electrical metrology in the next fifteen years. The emphasis on standards based on fundamental constants of nature and on quantum-mechanical principles will move from the base units to
Displaying 1001 - 1025 of 2964
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