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NIST Authors in Bold

Displaying 676 - 700 of 2964

Improving Fatigue Strength of Alumina through Surface Grading

May 9, 2011
Author(s)
Yvonne B. Gerbig, Linlin Ren, Lela Liu, Sanjit Bhowmick, Malvin Janal, Van Thompson, Yu Zhang
Porcelain veneered alumina crown restorations often fail from bulk fracture resulting from radial cracks that initiate at the cementation surface with repeated flexure of the stiffer crown layers on the soft dentin support. We hypothesize that bulk

NIST s Integrated Colony Enumerator (NICE)

August 11, 2009
Author(s)
Matthew L. Clarke, Jeeseong Hwang
Enumeration of bacterial colonies in an agar plate is simple in concept, but automated colony counting is difficult due to variations in colony color, size, shape, contrast, and density, as well as colony overlap. Furthermore, in applications where high

A Model of Melting and Dripping Thermoplastic Objects in Fire

March 17, 2009
Author(s)
Kathryn M. Butler
A model of the melting and dripping behavior of thermoplastic materials in fire is being developed using the Particle Finite Element Method (PFEM), which is capable of tracking the large changes in shape inherent to this problem in addition to solving the

Prediction of the [Na 1/2 Bi 1/2 ] TiO 3 Ground State

February 1, 2001
Author(s)
Benjamin P. Burton, Eric J. Cockayne
The Vienna Ab-initio Simulation Package (VASP) was used to perform fully relaced, planeware psudopotential calculations of formation energies (δE V ASP) for a large number of ordered supercells in the perovskite based system NaTiO 3 - BiTiO 3, including 36

Effects of Lightpipe Proximity on Si Wafer Temperature in Rapid Thermal Processing Tools

September 1, 2003
Author(s)
Kenneth G. Kreider, D H. Chen, D P. DeWitt, William A. Kimes, Benjamin K. Tsai
curate temperature measurements are critical in rapid thermal processing (RTP) of silicon wafers for thermal oxidation and dopant anneals. Many RTP tools use lightpipe radiation thermometers (LPRTs) to measure the wafer temperatures during processing

Effects of Lightpipe Proximity on Si Wafer Temperature in Rapid Thermal Processing Tools

September 1, 2003
Author(s)
Kenneth G. Kreider, D H. Chen, D P. DeWitt, William A. Kimes, Benjamin K. Tsai
Lightpipe radiation thermometers (LPRTs) are the preferred temperature monitoring sensor in most rapid thermal processing (RTP) tools for semiconductor fabrication. These tools are used for dopant anneal, gate oxide formation, and other high temperature

Impulsive Loading of Cellular Media in Sandwich Construction

July 31, 2005
Author(s)
Joseph A. Main, George A. Gazonas
Motivated by recent efforts to mitigate blast loading using energy absorbing materials, this paper investigates the uniaxial crushing of cellular media in sandwich construction under impulsive pressure loading. The cellular core material is modeled using a

Sensitivity of Electronic Structure to Crystal Distortions in Infinite-Layered LaNiO2

January 23, 2025
Author(s)
S. Rathnayaka, S. Yano, J. B. Moree, K. Kawashima, J. Akimitsu, Craig Brown, J. Neuefeind, D. Louca
Recent observations of unconventional superconductivity (SC) in thin films of LaNiO2 (critical temperature Tc  10 K) and in bulk single crystals of La3Ni2O7 under pressure Tc  80K have cemented a long sought-after class of SC nickelates. In La1−xSrxNiO2

Key Considerations for Microbial Viability Measurements

January 14, 2020
Author(s)
Joy Dunkers, Sandra M. Da Silva, Stephanie Servetas, James J. Filliben, Guilherme L. Pinheiro, Nancy Lin
Making reliable measurements of antimicrobial killing efficacy requires careful consideration of the sources of biological variability, measurement bias and error throughout the entire workflow. For ultraviolet-C (UV-C) disinfection, killing efficacy is

GRADED STRUCTURES FOR ALL-CERAMIC RESTORATIONS

May 17, 2010
Author(s)
Yu Zhang, H Chai, Brian R. Lawn
One failure mode of all-ceramic crown restorations is radial cracking at the cementation surface, from occlusally-induced flexure of the stiffer crown layer on the softer dentin underlayer. We hypothesize that such failure may be substantially mitigated by

Whisker Formation in Pb-Free Surface Finishes

February 2, 2010
Author(s)
Gery R. Stafford, Maureen E. Williams, Jae W. Shin, Kil-Won Moon, William J. Boettinger, Carlos R. Beauchamp
… time. The appearance of hillocks and/or whiskers following plating is influenced by several factors such as intrinsic …

Failure of Glass Layers on Polymeric Substrates From Vickers Indentation

March 25, 2006
Author(s)
Herzl Chai, Brian R. Lawn
A study is made of median crack evolution in brittle coatings subjected to sharp contacts. A model bilayer system consisting of a glass plate bonded to a polycarbonate base, with a Vickers pyramid as indenter, is used to demonstrate the evolution in situ
Displaying 676 - 700 of 2964
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